J. Müller
发表
R. Hoffmann,
J. Calvo,
S. Riedel,
2018,
IEEE Transactions on Electron Devices.
R. Hoffmann,
M. Czernohorsky,
P. Polakowski,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
R. Hoffmann,
J. Calvo,
S. Riedel,
2018,
Applied Physics Letters.
R. Hoffmann,
L. Eng,
M. Czernohorsky,
2019,
IEEE Transactions on Electron Devices.
R. Hoffmann,
L. Eng,
M. Czernohorsky,
2020,
IEEE Transactions on Electron Devices.
R. Sporer,
P. Polakowski,
H. J. Kim,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
M. Trentzsch,
S. Flachowsky,
R. Richter,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
H. Mulaosmanovic,
S. Müller,
S. Slesazeck,
2017,
2017 Symposium on VLSI Technology.
R. Hoffmann,
L. Eng,
M. Czernohorsky,
2020,
IEEE Transactions on Electron Devices.
F. Koushan,
G. Kuzmanov,
S. Soss,
2021,
2021 Symposium on VLSI Technology.
M. Trentzsch,
H. Mulaosmanovic,
S. Slesazeck,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
L. Larcher,
A. Padovani,
F. Koushan,
2021,
2021 Symposium on VLSI Technology.
J. V. Houdt,
R. Hoffmann,
L. Eng,
2020,
2020 IEEE International Memory Workshop (IMW).
G. Gerlach,
R. Hoffmann,
S. Beyer,
2023,
IEEE Electron Device Letters.
G. Gerlach,
R. Hoffmann,
S. Beyer,
2023,
2023 IEEE International Memory Workshop (IMW).
Stefan Slesazeck,
Thomas Mikolajick,
Uwe Schroeder,
2016,
2016 46th European Solid-State Device Research Conference (ESSDERC).
S. Slesazeck,
T. Mikolajick,
J. Muller,
2012,
2012 Symposium on VLSI Technology (VLSIT).
R. Hoffmann,
T. Mikolajick,
L. Frey,
2012,
IEEE Electron Device Letters.
Reliability Characteristics of Ferroelectric $ \hbox{Si:HfO}_{2}$ Thin Films for Memory Applications
T. Mikolajick,
S. Mueller,
J. Muller,
2013,
IEEE Transactions on Device and Materials Reliability.
J. V. Houdt,
R. Hoffmann,
L. Eng,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
T. Herrmann,
A. Zaka,
M. Trentzsch,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
M. Trentzsch,
S. Flachowsky,
H. Mulaosmanovic,
2016,
2016 16th Non-Volatile Memory Technology Symposium (NVMTS).
S. Henker,
Stefan Slesazeck,
Thomas Mikolajick,
2016
.
J. Muller,
W. Weinreich,
J. Sundqvist,
2014,
2014 IEEE 6th International Memory Workshop (IMW).