S. Ozev

发表

Experimental and Simulated Cycling of ISFET Electric Fields for Drift Reset

D. Welch, S. Shah, S. Ozev, 2013, IEEE Electron Device Letters.

Quantifying the Impact of Process Variability on Microprocessor Behavior

Sule Ozev, Daniel J. Sorin, Bogdan F. Romanescu, 2006 .

Rail Clamp with Dynamic Time-Constant Adjustment

Ramachandran Venkatasubramanian, Sule Ozev, Kent Oertle, 2016, IEEE Journal of Solid-State Circuits.

Autonomic Computing via Dynamic Self-Repair of Hardware Faults

D. Sorin, S. Ozev, 2006 .

Digital Calibration and Effective Number of Bit Prediction for Pipeline ADC

H. Barnaby, J. Kitchen, S. Ozev, 2013 .

Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections

Sule Ozev, Muslum Emir Avci, S. Ozev, 2020, 2020 IEEE International Test Conference (ITC).

An Electrical Stimulus based Built In Self Test (BIST) circuit for Capacitive MEMS accelerometer by Vinay Kundur A Thesis Presented in Partial Fulfillment of the Requirements for the Degree Master of Science Approved July 2013 by the Graduate Supervisory Committee:

Chair, B. Bakkaloglu, S. Kiaei, 2013 .

Hierarchical Fault Response Modeling of Analog/RF Circuits by Gurusubrahmaniyan Subrahmaniyan Radhakrishnan A Thesis Presented in Partial Fulfillment of the Requirements for the Degree Master of Science Approved November 2010 by the Graduate Supervisory Committee: Sule Ozev, Chair

Yu Cao, J. Christen, S. Ozev, 2010 .

Detecting Anomaly in Chemical Sensors via L1-Kernel-Based Principal Component Analysis

A. Cetin, S. Ozev, Hongyi Pan, 2022, IEEE Sensors Letters.

Deep-Learning-Based Gas Leak Source Localization From Sparse Sensor Data

S. Ozev, A. Çetin, Diaa Badawi, 2022, IEEE Sensors Journal.

Hierarchical analysis of process variation for mixed-signal systems

Fang Liu, Sule Ozev, S. Ozev, 2005, Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005..

Detecting Gas Vapor Leaks Using Uncalibrated Sensors

A. Enis Çetin, Sule Ozev, Alex Orailoglu, 2019, IEEE Access.

Adaptive Generation of Unique IDs for Digital Chips through Analog Excitation

Ozgur Sinanoglu, Sule Ozev, Chandra K. H. Suresh, 2015, TODE.

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode

Vishwanath Natarajan, Shreyas Sen, Mustapha Slamani, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Zero-overhead self test and calibration of RF transceivers

Sule Ozev, Jae Woong Jeong, Afsaneh Nassery, 2013, 2013 IEEE International Test Conference (ITC).

Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters

Shreyas Sen, Sule Ozev, T. M. Mak, 2013, 2013 IEEE 31st VLSI Test Symposium (VTS).

Fault analysis and simulation of large scale industrial mixed-signal circuits

Sule Ozev, LeRoy Winemberg, Ender Yilmaz, 2013, 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Fast and Accurate DPPM Computation Using Model Based Filtering

Sule Ozev, Ender Yilmaz, S. Ozev, 2011, 2011 Sixteenth IEEE European Test Symposium.

Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST

Sule Ozev, Erdem Serkan Erdogan, S. Ozev, 2010, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Defect filter for alternate RF test

Salvador Mir, Sule Ozev, Haralampos-G. D. Stratigopoulos, 2009, 2010 15th IEEE European Test Symposium.

Diagnosis of assembly failures for System-in-Package RF tuners

Sule Ozev, Philippe Cauvet, Erdem Serkan Erdogan, 2008, 2008 IEEE International Symposium on Circuits and Systems.

Defect-Oriented Testing of RF Circuits

Sule Ozev, Erkan Acar, S. Ozev, 2008, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead

Sule Ozev, Alex Orailoglu, A. Orailoglu, 2004, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Wafer-level RF test and DfT for VCO modulating transceiver architectures

Sule Ozev, Christian Olgaard, S. Ozev, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

Electrical calibration of spring-mass MEMS capacitive accelerometers

Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, 2013, 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Enabling Large-scale Fine-grained Simulation of IED Vapor Concentration in Open-air Environments

Sule Ozev, Jennifer Blain Christen, Agamyrat Agambayev, 2020, 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS).

An Underwater Behavior Recognition System for Marine Life

J. Christen, S. Ozev, Favour Nerrise, 2021 .

Tolerating hard faults in microprocessor array structures

Sule Ozev, Daniel J. Sorin, Fred A. Bower, 2004, International Conference on Dependable Systems and Networks, 2004.

Wafer-Level Defect Screening for “Big-D/Small-A” Mixed-Signal SoCs

Krishnendu Chakrabarty, Sule Ozev, Vikram Iyengar, 2009, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Test yield estimation for analog/RF circuits over multiple correlated measurements

Fang Liu, Sule Ozev, Erkan Acar, 2007, 2007 IEEE International Test Conference.

Efficient simulation of parametric faults for multi-stage analog circuits

Fang Liu, Sule Ozev, S. Ozev, 2007, 2007 IEEE International Test Conference.

Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup

Sule Ozev, Erkan Acar, S. Ozev, 2007, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Fast hierarchical process variability analysis and parametric test development for analog/RF circuits

Fang Liu, Sule Ozev, S. Ozev, 2005, 2005 International Conference on Computer Design.

Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector

Marian Verhelst, Mustapha Slamani, Sule Ozev, 2012, 2012 IEEE 30th VLSI Test Symposium (VTS).

A Reconfigurable 0.1–10 MHz DT Passive Dynamic Zoom ADC for Cellular Receivers

Sule Ozev, Osman Emir Erol, S. Ozev, 2020, IEEE Transactions on Circuits and Systems I: Regular Papers.

End-to-end testability analysis and DfT insertion for mixed-signal paths

Sule Ozev, Alex Orailoglu, A. Orailoglu, 2004, IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings..

Self-Powered Wearable IoT Devices for Health and Activity Monitoring

Ümit Y. Ogras, Sule Ozev, Yigit Tuncel, 2020, Found. Trends Electron. Des. Autom..

A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources

Vishwanath Natarajan, Shreyas Sen, Sule Ozev, 2017, ACM Trans. Design Autom. Electr. Syst..

Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector

Marian Verhelst, Mustapha Slamani, Sule Ozev, 2015, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Low Cost MIMO Testing for RF Integrated Circuits

Sule Ozev, Erkan Acar, S. Ozev, 2010, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Low-Cost Characterization and Calibration of RF Integrated Circuits through $I$–$Q$ Data Analysis

Sule Ozev, Erkan Acar, S. Ozev, 2009, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Digital calibration of RF transceivers for I-Q imbalances and nonlinearity

Sule Ozev, Erkan Acar, S. Ozev, 2007, 2007 25th International Conference on Computer Design.

A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up

Sule Ozev, Erkan Acar, Kevin B. Redmond, 2007, 25th IEEE VLSI Test Symposium (VTS'07).

Enhanced Error Vector Magnitude (EVM) Measurements for Testing WLAN Transceivers

E. Acar, S. Ozev, K.B. Redmond, 2006, 2006 IEEE/ACM International Conference on Computer Aided Design.

Efficient Testing of RF MIMO Transceivers Used in WLAN Applications

Sule Ozev, Erkan Acar, S. Ozev, 2006, 2006 International Conference on Computer Design.

Defect-based RF testing using a new catastrophic fault model

Sule Ozev, Erkan Acar, S. Ozev, 2005, IEEE International Conference on Test, 2005..

Diagnosis of the failing component in RF receivers through adaptive full-path measurements

Sule Ozev, Erkan Acar, S. Ozev, 2005, 23rd IEEE VLSI Test Symposium (VTS'05).

Hierarchical analysis of process variation for mixed-signal systems

Fang Liu, S. Ozev, S. Ozev, 2005, Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005..

Delayed-RF based test development for FM transceivers using signature analysis

S. Ozev, E. Acar, 2004, 2004 International Conferce on Test.

Low cost characterization of RF transceivers through IQ data analysis

Sule Ozev, Erkan Acar, S. Ozev, 2007, 2007 IEEE International Test Conference.

Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements

Fang Liu, Sule Ozev, Martin A. Brooke, 2006, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search

Fang Liu, Sule Ozev, Martin A. Brooke, 2004, IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004..

Energy-Efficient Image Recognition System for Marine Life

Sule Ozev, Jennifer Blain Christen, H. Seckin Demir, 2020, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Parametric fault diagnosis for analog circuits using a Bayesian framework

Fang Liu, Sule Ozev, Plamen K. Nikolov, 2006, 24th IEEE VLSI Test Symposium.

Online Built-In Self-Test of High Switching Frequency DC–DC Converters Using Model Reference Based System Identification Techniques

Sule Ozev, Bertan Bakkaloglu, Navankur Beohar, 2018, IEEE Transactions on Circuits and Systems I: Regular Papers.

Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants

Daniel W. Gulick, J. Christen, Seunghyun Lee, 2022, IEEE VLSI Test Symposium.

A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise

Sule Ozev, Erdem Serkan Erdogan, S. Ozev, 2006, 2006 IEEE International Test Conference.

Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation

Sule Ozev, Gurusubrahmaniyan Subrahmaniyan Radhakrishnan, S. Ozev, 2011, J. Electron. Test..

IMPRoVED: Integrated Method to Predict PostRouting setup Violations in Early Design Stages

S. Ozev, Suhas Krishna Kashyap, 2022, ACM Trans. Design Autom. Electr. Syst..

PCB Hardware Trojans: Attack Modes and Detection Strategies

Ümit Y. Ogras, Sule Ozev, Matthew McGuire, 2019, 2019 IEEE 37th VLSI Test Symposium (VTS).

Real-Time Low-Cost Drift Compensation for Chemical Sensors Using a Deep Neural Network With Hadamard Transform and Additive Layers

Sule Ozev, Diaa Badawi, A. Enis Cetin, 2021, IEEE Sensors Journal.

Adaptive multidimensional outlier analysis for analog and mixed signal circuits

Kenneth M. Butler, Sule Ozev, Ender Yilmaz, 2011, 2011 IEEE International Test Conference.

Post-production adaptation of RF circuits for application-specific performance metrics

Sule Ozev, Jennifer Kitchen, Doohwang Chang, 2016, 2016 IEEE International Symposium on Circuits and Systems (ISCAS).

Adaptive test flow for mixed-signal/RF circuits using learned information from device under test

Kenneth M. Butler, Sule Ozev, Ender Yilmaz, 2010, 2010 IEEE International Test Conference.

Built-In EVM Measurement With Negligible Hardware Overhead

Sule Ozev, Ender Yilmaz, Afsaneh Nassery, 2014, IEEE Design & Test.

Built-in EVM measurement for OFDM transceivers using all-digital DFT

Sule Ozev, Erkan Acar, Ender Yilmaz, 2009, 2009 International Test Conference.

Dynamic test scheduling for analog circuits for improved test quality

Sule Ozev, Ender Yilmaz, S. Ozev, 2008, 2008 IEEE International Conference on Computer Design.

Statistical Test Development for Analog Circuits Under High Process Variations

Fang Liu, Sule Ozev, S. Ozev, 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Test Application for Analog/RF Circuits With Low Computational Burden

Sule Ozev, Ender Yilmaz, S. Ozev, 2012, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems

Fei Su, Krishnendu Chakrabarty, Sule Ozev, 2004, Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004..

Discrete Cosine Transform Based Causal Convolutional Neural Network for Drift Compensation in Chemical Sensors

Sule Ozev, Diaa Badawi, A. Enis Cetin, 2020, ICASSP 2021 - 2021 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP).

Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation

S. Ozev, Bora Bilgic, 2023, IEEE Design & Test.

Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor

Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz, 2007, 2007 25th International Conference on Computer Design.

Online diagnosis of hard faults in microprocessors

Sule Ozev, Daniel J. Sorin, Fred A. Bower, 2007, TACO.

In-Field Recovery of RF Circuits from Wearout Based Performance Degradation

Sule Ozev, Sayfe Kiaei, Jennifer Kitchen, 2020, IEEE Transactions on Emerging Topics in Computing.

Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators

Sule Ozev, Mehmet Ince, S. Ozev, 2020, 2020 IEEE European Test Symposium (ETS).

Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection

Sule Ozev, Wei Fu, Joonsung Park, 2019, 2019 IEEE European Test Symposium (ETS).

A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters

Sule Ozev, Bertan Bakkaloglu, Maryam Shafiee, 2017, TODE.

Built-in self-test for stability measurement of low dropout regulator

Sule Ozev, LeRoy Winemberg, Ender Yilmaz, 2017, 2017 IEEE International Test Conference (ITC).

Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers

Sule Ozev, Erdem Serkan Erdogan, S. Ozev, 2008, 26th IEEE VLSI Test Symposium (vts 2008).

Detection Mechanisms for Unauthorized Wireless Transmissions

Ümit Y. Ogras, Sule Ozev, Bertan Bakkaloglu, 2018, ACM Trans. Design Autom. Electr. Syst..

Multi-objective design optimization for flexible hybrid electronics

Jaehyun Park, Ümit Y. Ogras, Sule Ozev, 2016, 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).

A Case for Computer Architecture Performance Metrics that Reflect Process Variability

Sule Ozev, Daniel J. Sorin, Bogdan F. Romanescu, 2007 .

Disturbance-free BIST for loop characterization of DC-DC buck converters

Sule Ozev, Bertan Bakkaloglu, Navankur Beohar, 2015, 2015 IEEE 33rd VLSI Test Symposium (VTS).

Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements

Sule Ozev, Yanjun Li, Ender Yilmaz, 2019, ACM Trans. Design Autom. Electr. Syst..

Automated System-Level Test Development for Mixed-Signal Circuits

Sule Ozev, Alex Orailoglu, A. Orailoglu, 2003 .

Online information utility assessment for per-device adaptive test flow

Yanjun Li, Sule Ozev, Peter Sarson, 2018, 2018 IEEE 36th VLSI Test Symposium (VTS).

Revealing Sea Turtle Behavior in Relation to Fishing Gear Using Color-Coded Spatiotemporal Motion Patterns With Deep Neural Networks

S. Ozev, B. Witherington, J. Reavis, 2021, Frontiers in Marine Science.

Applying architectural vulnerability Analysis to hard faults in the microprocessor

Sule Ozev, Derek Hower, Daniel J. Sorin, 2006, SIGMETRICS '06/Performance '06.

Autonomic microprocessor execution via self-repairing arrays

Sule Ozev, Daniel J. Sorin, Fred A. Bower, 2005, IEEE Transactions on Dependable and Secure Computing.

Lazy Error Detection for Microprocessor Functional Units

Sule Ozev, Albert Meixner, Daniel J. Sorin, 2007, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007).

A mechanism for online diagnosis of hard faults in microprocessors

Sule Ozev, Daniel J. Sorin, Fred A. Bower, 2005, 38th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO'05).

Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring

Kenneth M. Butler, Sule Ozev, Ender Yilmaz, 2013, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Concurrent testing of digital microfluidics-based biochips

Fei Su, Krishnendu Chakrabarty, Sule Ozev, 2006, TODE.

Adaptive test elimination for analog/RF circuits

Sule Ozev, Ender Yilmaz, S. Ozev, 2009, 2009 46th ACM/IEEE Design Automation Conference.