G. Meaden

发表

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.

A. Wilkinson, G. Meaden, D. Dingley, 2006, Ultramicroscopy.

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.

A. Wilkinson, R. Fortunier, K. Mingard, 2010, Ultramicroscopy.

A review of EBSD: from rudimentary on line orientation measurements to high resolution elastic strain measurements over the past 30 years.

A. Day, G. Meaden, D. Dingley, 2018, IOP Conference Series: Materials Science and Engineering.

High resolution mapping of strains and rotations using electron backscatter diffraction

David J. Dingley, Angus J. Wilkinson, Graham Meaden, 2006 .

Comments on the paper "Bragg's law diffraction simulations for electron backscatter diffraction analysis" by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood.

Roland Fortunier, Ken Mingard, Claire Maurice, 2010, Ultramicroscopy.

Strain Mapping Using Electron Backscatter Diffraction

A. Wilkinson, G. Meaden, D. Dingley, 2009 .

High angular resolution electron backscatter diffraction : measurement of strain in functional and structural materials

Ben Britton, Ian Holton, Graham Meaden, 2014 .

Mapping strains at the nanoscale using electron back scatter diffraction

A. Wilkinson, G. Meaden, D. Dingley, 2009 .

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.

Angus J Wilkinson, Graham Meaden, A. Wilkinson, 2010, Journal of electron microscopy.

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.

A. Wilkinson, G. Meaden, D. Dingley, 2010, Journal of electron microscopy.