G.R. Allen

Compendium of Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory

G.R. Allen, 2008, 2008 IEEE Radiation Effects Data Workshop.

Upset Characterization and Test Methodology of the PowerPC405 Hard-Core Processor Embedded in Xilinx Field Programmable Gate Arrays

G.M. Swift, G.R. Allen, G. Miller, 2007, 2007 IEEE Radiation Effects Data Workshop.

SEU-Susceptibility of Logical Constants in Xilinx FPGA Designs

Chen Wei Tseng, G.M. Swift, G.R. Allen, 2009, IEEE Transactions on Nuclear Science.

Single Event Effects Test Results for Advanced Field Programmable Gate Arrays

G.M. Swift, G.R. Allen, G. Swift, 2006, 2006 IEEE Radiation Effects Data Workshop.