Oriol Avino-Salvado

Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling

Cyril Buttay, Wissam Sabbah, Faical Arabi, 2017, Microelectron. Reliab..

Simplified Mathematical Model for Calculating the Oxygen Excess Ratio of a PEM Fuel Cell System in Real-Time Applications

Tine Konjedic, Javier Calvente, Roberto Giral, 2014, IEEE Transactions on Industrial Electronics.

Benefits of GaN transistors and embedding in PCB laminates

Cyril Buttay, Pascal Bevilacqua, Bruno Allard, 2019 .

High temperature ageing of microelectronics assemblies with SAC solder joints

Hervé Morel, Cyril Buttay, Alexandrine Guédon-Gracia, 2017, Microelectron. Reliab..

Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode

Hervé Morel, Cyril Buttay, Stéphane Lefebvre, 2018, Microelectron. Reliab..

VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate

Dominique Planson, Alberto Castellazzi, Oriol Avino-Salvado, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).