S. Erasmus

发表

Reduction of noise in TV rate electron microscope images by digital filtering

S. Erasmus, 1982 .

Damage to resist structures during scanning electron microscope inspection

S. Erasmus, 1987 .

On‐line computation of diffractograms for the analysis of SEM images

S. Erasmus, K. C. A. Smith, D. Holburn, 1980 .

Procedures for focusing, stigmating and alignment in high resolution electron microscopy

David J. Smith, W. O. Saxton, S. Erasmus, 1983 .

An automatic focusing and astigmatism correction system for the SEM and CTEM

K. C. A. Smith, S. J. Erasmus, S. Erasmus, 1982 .

Dynamic observation of defect annealing in CdTe at lattice resolution

David J. Smith, R. Sinclair, W. Nixon, 1982, Nature.

Edge Recognition in SEM Metrology

S. Erasmus, J. F. Mancuso, S. Erasmus, 1986, Optics & Photonics.

This technology has not been applied to SEM and difficulties are expected in its use in

S. Erasmus, S. Erasmus, 2017 .