Young-Hee Kim

发表

Interconnection parameter extraction of printed circuit board by hybrid measurements of TDR and S-parameter

Seongsoo Lee, Jae-Kyung Wee, Young-Hee Kim, 2002 .

A New CMOS Bandgap Reference Voltage Generator for CMOS APS Imager

Y. S. Kim, G. Cho, K. H. Kim, 2003 .

CMOS sense-amplifier type flip-flop having improved setup/hold margin

Hong-June Park, Seong-Ik Cho, Young-Hee Kim, 2003 .

A Voltage-Down Converter for Low-Voltage SoC

Gyu-Ho Lim, Young-Hee Kim, Mu-Hun Park, 2004 .

CMOS-Compatible Self-Aligned In0.53Ga0.47As MOSFETs With Gate Lengths Down to 30 nm

R. M. Martin, E. Joseph, M. Frank, 2014, IEEE Transactions on Electron Devices.

A Half-VDD Voltage Generator for Low-Voltage DRAM

Seong-Ik Cho, Young-Hee Kim, Pan-Bong Ha, 2004 .

A VPP (Boosted Voltage) Generator for wide voltage range EEPROM

Young-Hee Kim, Jong-Hee Kim, Young-Hee Kim, 2006 .

A Multi-Stage CMOS Charge Pump for Low-Voltage Memories

Kyeong-Sik Min, Jin-Yong Chung, Seong-Ik Cho, 2002 .

Open quantum dots modeled with microwave cavities

Young-Hee Kim, 2004 .

Reliability characteristics of high-k dielectrics

Young-Hee Kim, Jack C. Lee, Jack C. Lee, 2004, Microelectron. Reliab..

Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability

Young-Hee Kim, Jack C. Lee, Jack C. Lee, 2005, Hf-Based High-k Dielectrics.

Reliability of Pb-free preplated leadframe under atmosphere and accelerated aging test

Jongwoo Park, Hyun-Goo Jeon, Seung-Woo Lee, 2006 .

Development and characterization of CMOS-based monolithic X-ray imager sensor

G. Cho, J. Bae, Young-Hee Kim, 2007, 2007 IEEE Nuclear Science Symposium Conference Record.

Charge Defects, Vt Shifts, and the Solution to the High-K Metal Gate n-MOSFET Problem

V. Narayanan, B. Linder, M. Copel, 2006 .