F. Yasin
发表
G. Kar,
N. Jossart,
J. Swerts,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
G. Kar,
K. Garello,
F. Yasin,
2019,
2019 IEEE 11th International Memory Workshop (IMW).
G. Sala,
K. Garello,
P. Gambardella,
2020,
Nature Nanotechnology.
G. Kar,
A. Mallik,
D. Verkest,
2021,
2021 Symposium on VLSI Technology.
G. Kar,
R. Degraeve,
J. Swerts,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
G. Kar,
W. Kim,
D. Crotti,
2021,
2104.09599.
G. Kar,
K. Garello,
S. Rao,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
J. Swerts,
N. Jossart,
G. S. Kar,
2019,
2019 Symposium on VLSI Technology.
W. Dehaene,
R. Degraeve,
D. Verkest,
2020,
2020 IEEE Symposium on VLSI Technology.
A. Charley,
D. Crotti,
H. Sadeghian,
2022,
Advanced Lithography.
G. Kar,
J. Swerts,
J. V. Houdt,
2018,
Applied Physics Letters.
Gian Francesco Lorusso,
Naoto Horiguchi,
Christopher J. Wilson,
2017,
Advanced Lithography.
G. Kar,
D. Crotti,
K. Garello,
2021,
2021 Symposium on VLSI Technology.
Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node
J. Swerts,
A. Spessot,
D. Yakimets,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
Nico Jossart,
Stefan Cosemans,
Davide Crotti,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
E. Beyne,
G. Kar,
J. Ryckaert,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
Deterministic and field-free voltage-controlled MRAM for high performance and low power applications
G. Groeseneken,
J. Van Houdt,
Y. C. Wu,
2020,
2020 IEEE Symposium on VLSI Technology.
S. H. Sharifi,
Woojin Kim,
L. Goux,
2021,
2021 IEEE International Memory Workshop (IMW).
Dimitri Linten,
Philippe Roussel,
S. Rao,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
J. Swerts,
N. Jossart,
K. Garello,
2019,
2019 Symposium on VLSI Circuits.