T.J. Lee

3nm GAA Technology featuring Multi-Bridge-Channel FET for Low Power and High Performance Applications

S. Jung, D. Kim, K. Bhuwalka, 2018, 2018 IEEE International Electron Devices Meeting (IEDM).

True 7nm Platform Technology featuring Smallest FinFET and Smallest SRAM cell by EUV, Special Constructs and 3rd Generation Single Diffusion Break

S. Jung, D. Park, S. Maeda, 2018, 2018 IEEE Symposium on VLSI Technology.