C. Seet
发表
L. Y. Hau,
L. C. Goh,
J. W. Ting,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
Xiaoxuan Li,
C. Seet,
Xintong Zhu,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Xiaoxuan Li,
J. D. Lim,
C. Seet,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Mei Zhen Ng,
Xiaoxuan Li,
C. Seet,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Boon Kiat Lim,
A. See,
N. Yakovlev,
2004
.
C. Seet,
J. Widodo,
L. Hsia,
2009,
2009 IEEE International Interconnect Technology Conference.
A. See,
W. Lew,
S. Piramanayagam,
2018,
Journal of Physics D: Applied Physics.
Seung H. Kang,
Y. Obeng,
A. Oates,
2001
.
G. Xu,
C. Seet,
H. Huang,
1996
.
W. Lew,
F. Tan,
C. Seet,
2020,
Scientific Reports.
G. Xu,
J. Hrbek,
C. Seet,
1994
.
C. Seet,
Z. Zou,
Gu Xu,
1996
.
G. Xu,
C. Seet,
H. Huang,
1994
.
G. Xu,
C. Seet,
H. Huang,
1996
.
W. Lew,
P. Dananjaya,
C. Seet,
2023,
Nanotechnology.
S. T. Woo,
N. L. Chung,
S. Y. Siah,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
Aditya Kumar,
Jingming Huang,
C. Seet,
2011
.
W. Lew,
N. Thiyagarajah,
C. Seet,
2019,
Journal of Magnetism and Magnetic Materials.
Boon Kiat Lim,
A. See,
N. Yakovlev,
2005
.
J. Sudijono,
H. Zeng,
C. Seet,
2003
.
A. See,
J. Sudijono,
C. Tung,
2002
.
W. Lew,
A. Wee,
Xiaojiang Yu,
2021,
ACS nano.
D. Vigar,
C.M. Tan,
K. Pey,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
K. Pey,
C. Seet,
Y.K. Lim,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
L. Y. Hau,
J. W. Ting,
Y. Otani,
2020,
International Electron Devices Meeting.
J. Lam,
D. Shum,
S. T. Woo,
2018,
2018 IEEE Symposium on VLSI Technology.
W. Lew,
N. Thiyagarajah,
C. Seet,
2019,
Journal of Magnetism and Magnetic Materials.
W. Lew,
C. Seet,
W. Gan,
2021,
Applied Physics Letters.
T. Y. Lee,
L. Y. Hau,
L. C. Goh,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).