J. Watanabe
发表
T. Yamazaki,
T. Sugii,
K. Goto,
1995,
Proceedings of International Electron Devices Meeting.
T. Yamazaki,
T. Sugii,
K. Goto,
1999
.
Toshihiro Sugii,
K. Goto,
T. Sukegawa,
1998,
1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).