N. D. Sinh

Capture cross sections of defect states at the Si/SiO2 interface

W. Füssel, W. Fuhs, J. Albohn, 2000 .

Single-Crystalline Regions of Silicon-on-Glass for Thin-Film Transistors

F. Falk, S. Christiansen, M. Nerding, 2001 .

Two types of traps at the Si/SiO 2 interface characterized by their cross sections

W. Füssel, H. Flietner, W. Fuhs, 1999 .

Photovoltaic properties of polycrystalline silicon films thickened by laser melting

N. D. Sinh, J. Bergmann, E. Ose, 2000, Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036).

A new technology for crystalline silicon thin film solar cells on glass based on laser crystallization

F. Falk, H. Strunk, S. Christiansen, 2000, Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036).

Character of SiSiO2 interface states from analysis of the CV term spectra

H. Flietner, N. D. Sinh, 1976 .

Density of states and relaxation spectra of etched, H-terminated and naturally oxidized Si-surfaces and the accompanied defects

W. Füssel, H. Flietner, H. Angermann, 1996 .

Optimization of layered laser crystallization for thin-film crystalline silicon solar cells

E. Ose, J. Bergmann, Gudrun Andrä, 2002 .

Interface states of the Si/SiO2 system and their separation in groups

W. Füssel, H. Flietner, N. D. Sinh, 1977 .

Some investigations of the JFET gate leakage current as a function of temperature

N. D. Sinh, D. Cao, L. Q. Huy, 1991 .