H. Ceric
发表
J. Kraft,
F. Schrank,
F. Roger,
2012,
IEEE Transactions on Device and Materials Reliability.
H. Ceric,
M. Rovitto,
2016,
2016 IEEE 66th Electronic Components and Technology Conference (ECTC).
T. Grasser,
H. Enichlmair,
S. Tyaginov,
2015,
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon.
S. Selberherr,
T. Binder,
A. Hossinger,
2002,
International Conferencre on Simulation of Semiconductor Processes and Devices.
T. Grasser,
B. Stampfer,
M. Waltl,
2019,
Solid-State Electronics.
S. Selberherr,
J. Červenka,
R. L. De Orio,
2009,
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
S. Selberherr,
H. Ceric,
2007
.
I. Starkov,
T. Grasser,
C. Jungemann,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
H. Ceric,
A. Tcad,
C. Doppler,
2014
.
W. H. Zisser,
S. Selberherr,
R. Orio,
2014
.
S. Selberherr,
R. L. De Orio,
H. Ceric,
2011,
2011 International Conference on Simulation of Semiconductor Processes and Devices.
T. Detzel,
C. Taylor,
Rui Huang,
2010
.
I. Starkov,
T. Grasser,
C. Jungemann,
2011,
2011 International Conference on Simulation of Semiconductor Processes and Devices.
S. Selberherr,
R. L. De Orio,
H. Ceric,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
S. Selberherr,
A. Witvrouw,
H. Ceric,
2007,
2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems.
S. Selberherr,
H. Ceric,
C. Hollauer,
2006,
2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
T. Detzel,
W. Robl,
Rui Huang,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
R. L. de Orio,
S. Selberherr,
R. L. De Orio,
2022,
2022 IEEE International Interconnect Technology Conference (IITC).
R. L. de Orio,
S. Selberherr,
R. L. De Orio,
2022,
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
S. Selberherr,
R. Orio,
H. Ceric,
2014
.
S. Selberherr,
R. L. De Orio,
H. Ceric,
2011,
18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
S. Selberherr,
H. Ceric,
C. Hollauer,
2006,
2006 International Conference on Simulation of Semiconductor Processes and Devices.
H. Ceric,
S. Papaleo,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
K. Croes,
I. De Wolf,
H. Zahedmanesh,
2022,
2022 IEEE International Interconnect Technology Conference (IITC).
H. Ceric,
S. Papaleo,
W. Zisser,
2015,
2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
S. Selberherr,
J. Weinbub,
H. Ceric,
2014,
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
S. Selberherr,
R. L. De Orio,
H. Ceric,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
S. Selberherr,
T. Grasser,
S. Holzer,
2005,
Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..
T. Detzel,
W. Robl,
Rui Huang,
2010,
2010 IEEE International Reliability Physics Symposium.
S. Selberherr,
H. Ceric,
A. Singulani,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
S. Selberherr,
R. L. De Orio,
R. Orio,
2022,
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).
S. Selberherr,
J. Červenka,
R. L. De Orio,
2008,
2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Siegfried Selberherr,
Clemens Heitzinger,
Hajdin Ceric,
2003
.
Siegfried Selberherr,
Hajdin Ceric,
S. Selberherr,
2011
.
Siegfried Selberherr,
Hajdin Ceric,
Roberto Lacerda de Orio,
2010,
Microelectron. Reliab..
H. Ceric,
T. Detzel,
Rui Huang,
2010,
IEEE Transactions on Device and Materials Reliability.
Siegfried Selberherr,
Hajdin Ceric,
Roberto Lacerda de Orio,
2011,
Microelectron. Reliab..
S. Selberherr,
H. Ceric,
2015,
2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM).
S. Selberherr,
H. Ceric,
M. Rovitto,
2014,
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
S. Selberherr,
R. L. De Orio,
H. Ceric,
2013,
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
S. Selberherr,
K. Croes,
H. Zahedmanesh,
2023,
Journal of Applied Physics.
R. L. de Orio,
S. Selberherr,
K. Croes,
2021
.
H. Ceric,
H. Zahedmanesh,
K. Croes,
2019,
Microelectronics Reliability.
S. Selberherr,
R. Orio,
S. Carniello,
2008,
ECS Transactions.
H. Ceric,
M. Rovitto,
2015,
2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Siegfried Selberherr,
Hajdin Ceric,
Roberto Lacerda de Orio,
2012,
Microelectron. Reliab..
Siegfried Selberherr,
Hajdin Ceric,
Johann Cervenka,
2009,
2009 International Conference on Simulation of Semiconductor Processes and Devices.
Siegfried Selberherr,
Hajdin Ceric,
Johann Cervenka,
2009,
2009 International Conference on Simulation of Semiconductor Processes and Devices.
S. Selberherr,
R. Orio,
J. Cervenka,
2009,
2009 17th IFIP International Conference on Very Large Scale Integration (VLSI-SoC).
S. Selberherr,
J. Červenka,
R. L. De Orio,
2009,
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
S. Selberherr,
H. Ceric,
R.L. de Orio,
2009,
IEEE Transactions on Device and Materials Reliability.
S. Selberherr,
H. Ceric,
S. Carniello,
2008,
2008 International Conference on Simulation of Semiconductor Processes and Devices.
S. Selberherr,
H. Ceric,
R.L. de Orio,
2008,
2008 26th International Conference on Microelectronics.
S. Selberherr,
H. Ceric,
Roberto Lacerda de Orio,
2008
.
S. Selberherr,
R. L. De Orio,
H. Ceric,
2007,
2007 International Semiconductor Device Research Symposium.
S. Selberherr,
T. Grasser,
H. Ceric,
2006
.
H. Ceric,
A. S. Saleh,
H. Zahednamesh,
2021
.
S. Selberherr,
H. Ceric,
2014,
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
S. Selberherr,
R. L. De Orio,
H. Ceric,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
S. Selberherr,
H. Ceric,
R. L. de Orio,
2013,
2013 IEEE International Integrated Reliability Workshop Final Report.
Siegfried Selberherr,
Josef Weinbub,
Hajdin Ceric,
2014,
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
S. Selberherr,
H. Ceric,
2014,
IEEE International Interconnect Technology Conference.
S. Selberherr,
H. Ceric,
W. H. Zisser,
2013,
2013 IEEE International Integrated Reliability Workshop Final Report.
R. L. de Orio,
S. Selberherr,
J. Červenka,
2008,
2008 International Conference on Simulation of Semiconductor Processes and Devices.
Siegfried Selberherr,
Hajdin Ceric,
S. Selberherr,
2002,
Microelectronics and reliability.
S. Selberherr,
H. Puchner,
A. Gehring,
2005
.
Tibor Grasser,
Oliver Triebl,
Hajdin Ceric,
2010,
Microelectronics and reliability.
E. Seebacher,
T. Grasser,
H. Ceric,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
R. L. de Orio,
S. Selberherr,
H. Ceric,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
S. Selberherr,
H. Ceric,
2002,
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
Siegfried Selberherr,
Hajdin Ceric,
S. Selberherr,
2002,
International Conferencre on Simulation of Semiconductor Processes and Devices.
S. Selberherr,
M. Movahhedi,
A. Sheikholeslami,
2007,
IEEE Microwave and Wireless Components Letters.
D. Holec,
H. Ceric,
T. Grasser,
2015
.
T. Grasser,
H. Ceric,
R. Coppeta,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Karl Rupp,
Tibor Grasser,
Prateek Sharma,
2015,
IEEE Transactions on Electron Devices.
Tibor Grasser,
Prateek Sharma,
Hajdin Ceric,
2016
.
Tibor Grasser,
Christoph Jungemann,
Hajdin Ceric,
2011
.
Siegfried Selberherr,
Hajdin Ceric,
Roberto Lacerda de Orio,
2012,
Microelectron. Reliab..
R. L. de Orio,
S. Selberherr,
H. Ceric,
2012,
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
R. L. de Orio,
S. Selberherr,
F. Schanovsky,
2011,
2011 International Conference on Simulation of Semiconductor Processes and Devices.
R. L. de Orio,
S. Selberherr,
H. Ceric,
2010,
2010 International Conference on Simulation of Semiconductor Processes and Devices.
H. Ceric,
M. Rovitto,
S. Papaleo,
2016,
2016 IEEE 66th Electronic Components and Technology Conference (ECTC).
Siegfried Selberherr,
Hajdin Ceric,
Anderson P. Singulani,
2016,
IEEE Transactions on Device and Materials Reliability.
H. Ceric,
S. Papaleo,
W. Zisser,
2015,
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Siegfried Selberherr,
Tibor Grasser,
S. Holzer,
2005,
SPIE Microtechnologies.
S. Selberherr,
H. Ceric,
C. Hollauer,
2003,
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..
S. Selberherr,
H. Ceric,
C. Hollauer,
2014
.
Prateek Sharma,
Karl Rupp,
Tibor Grasser,
2015,
Microelectron. Reliab..
T. Grasser,
B. Kaczer,
J. Franco,
2014,
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).
Tibor Grasser,
Christoph Jungemann,
Oliver Triebl,
2011,
2011 International Conference on Simulation of Semiconductor Processes and Devices.
Siegfried Selberherr,
Hajdin Ceric,
Anderson Pires Singulani,
2013,
Microelectronics and reliability.
E. Langer,
H. Ceric,
A. Singulani,
2013,
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
R. L. de Orio,
S. Selberherr,
H. Ceric,
2022,
Solid-State Electronics.
H. Ceric,
M. Rovitto,
W. Zisser,
2015,
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
S. Selberherr,
H. Zahedmanesh,
R. Orio,
2021
.
Siegfried Selberherr,
Tibor Grasser,
Hajdin Ceric,
2005
.
L. Filipovic,
E. Langer,
H. Ceric,
2013,
2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
E. Langer,
H. Ceric,
A. P. Singulani,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
S. Selberherr,
H. Ceric,
A. Singulani,
2012,
2012 IEEE 14th Electronics Packaging Technology Conference (EPTC).
S. Selberherr,
J. Červenka,
H. Ceric,
2005,
2005 International Conference On Simulation of Semiconductor Processes and Devices.
Siegfried Selberherr,
Hajdin Ceric,
S. Selberherr,
2003
.
T. Grasser,
H. Ceric,
Y. Wimmer,
2014,
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).
Tibor Grasser,
Hajdin Ceric,
C. Jungemann,
2011,
Microelectron. Reliab..
I. Starkov,
T. Grasser,
S. Tyaginov,
2011,
2011 7th Conference on Ph.D. Research in Microelectronics and Electronics.