P. Tobin

发表

D. Gilmer, T. Ma, S. Samavedam, 2001, 2001 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers (Cat. No.01TH8517).

D. Tekleab, D. Gilmer, C. Tracy, 2005, IEEE Transactions on Device and Materials Reliability.

K. Kukli, M. Ritala, M. Leskelä, 2004 .

K. Reid, R. Hegde, P. Tobin, 1994, Proceedings of 1994 VLSI Technology Symposium.

Sergio A. Ajuria, Rama I. Hegde, Philip J. Tobin, 1995 .

James D. Hayden, James R. Pfiester, T. C. Mele, 1990 .

L. Vishnubhotla, T. Ma, P. Tobin, 1993, IEEE Electron Device Letters.

J. Chen, D. Connelly, J. Mogab, 1999, 1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).

S. Pearton, C. Hobbs, K. Lee, 2000 .

Fang Wang, Z. Çelik-Butler, P. Tobin, 2004, IEEE Transactions on Electron Devices.

Xin Guo, I. Yang, R. Hegde, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

J. Schaeffer, M. Raymond, C. Capasso, 2004, The Fourth International Workshop on Junction Technology, 2004. IWJT '04..

D. Gilmer, S. Samavedam, A. Demkov, 2003 .

Philip J. Tobin, Olubunmi O. Adetutu, A. Dip, 2000 .

D. Sellmyer, P. Tobin, B. Averbach, 1969 .

P. Abramowitz, P.J. Tobin, E. Luckowski, 2002, 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).

P. Abramowitz, J. Conner, E. Luckowski, 2002, Digest. International Electron Devices Meeting,.

Bich-Yen Nguyen, Phil Tobin, Kent J. Cooper, 1991, Other Conferences.

Philip J. Tobin, A. Dip, S. Samavedam, 1999 .

J. Schaeffer, C. Capasso, M. Rendon, 2004 .

B. E. White, Rama I. Hegde, Dina H. Triyoso, 2006 .

M. L. Lovejoy, W.J. Taylor, J.M. Grant, 2004, IEEE Transactions on Electron Devices.

H. Tseng, P. Tobin, S. Hong, 1995, 1995 IEEE International SOI Conference Proceedings.

P. Tobin, H.-H. Tseng, Stella Hong, 1995 .

Hsing-Huang Tseng Hsing-Huang Tseng, P.J. Tobin, F.K. Baker, 1990, Digest of Technical Papers.1990 Symposium on VLSI Technology.

Hsing-Huang Tseng, James D. Hayden, James R. Pfiester, 1989, International Technical Digest on Electron Devices Meeting.

Fang Wang, Z. Celik-Butler, A. Zlotnicka, 2004, IEEE Transactions on Electron Devices.

S. Samavedam, E. Luckowski, C. Capasso, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

Hsing-Huang Tseng, Siva Prasad Devireddy, Philip J. Tobin, 2009, Microelectron. Reliab..

Hsing-Huang Tseng, Bigang Min, Siva Prasad Devireddy, 2007, Microelectron. Reliab..

Fang Wang, Z. Celik-Butler, A. Zlotnicka, 2006, IEEE Transactions on Electron Devices.

Zeynep Celik-Butler, Bigang Min, Fang Wang, 2005, SPIE International Symposium on Fluctuations and Noise.

Sergio A. Ajuria, Rama I. Hegde, Philip J. Tobin, 1994 .

J.C. Lee, S. Mudanai, R. Nieh, 2002, IEEE Electron Device Letters.

S. Samavedam, J. Mogab, Philip J. Tobin, 2001, 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207).

H. Tseng, P. Tobin, 1993, Proceedings of IEEE International Electron Devices Meeting.

M. L. Lovejoy, W.J. Taylor, J.M. Grant, 2004, IEEE Transactions on Electron Devices.

D. Gilmer, C. Tracy, A. Haggag, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

D. Gilmer, S. Samavedam, A. Demkov, 2003, IEEE International Electron Devices Meeting 2003.

J. Chen, S. Samavedam, L. Prabhu, 2000, 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125).

P. Tobin, Y. Okada, S. Ajuria, 1993, Symposium 1993 on VLSI Technology.