Xiaowei Zhu

Frequency dependence of soft error rates for sub-micron CMOS technologies

N. Leland, D. Moyer, L. Massengill, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

SINGLE EVENT EFFECTS

Lloyd W. Massengill, Jason Lowe, Hugh Barnaby, 2002 .

Impact of scaling on soft-error rates in commercial microprocessors

Lloyd W. Massengill, N. Seifert, Xiaowei Zhu, 2002 .

Characterization of Neutron- and Alpha-Particle-Induced Transients Leading to Soft Errors in 90-nm CMOS Technology

B. Narasimham, W. T. Holman, R.A. Reed, 2009, IEEE Transactions on Device and Materials Reliability.