R. Hokinson

Frequency dependence of soft error rates for sub-micron CMOS technologies

N. Leland, D. Moyer, L. Massengill, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

Implementation of an Alpha microprocessor in SOI

R. Hokinson, D. Clay, J. Clouser, 2003, 2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC..

SINGLE EVENT EFFECTS

Lloyd W. Massengill, Jason Lowe, Hugh Barnaby, 2002 .

Historical trend in alpha-particle induced soft error rates of the Alpha/sup TM/ microprocessor

R. Hokinson, N. Seifert, D. Moyer, 2001, 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).