C. Jahan
发表
O. Faynot,
G. Vizkelethy,
L. Tosti,
2006,
IEEE Transactions on Nuclear Science.
J. Nodin,
J. Cluzel,
A. Roule,
2009,
2009 IEEE International Memory Workshop.
A. Toffoli,
O. Cueto,
A. Roule,
2010,
IEEE Electron Device Letters.
A. Toffoli,
H. Grampeix,
B. De Salvo,
2013,
IEEE Transactions on Electron Devices.
O. Faynot,
S. Cristoloveanu,
M. Gaillardin,
2006,
IEEE Transactions on Nuclear Science.
Sorin Cristoloveanu,
Olivier Faynot,
C. Jahan,
2006
.
Sorin Cristoloveanu,
Simon Deleonibus,
Olivier Faynot,
2006
.
X. Garros,
O. Faynot,
M. Vinet,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
G. Reimbold,
Sylvain Maitrejean,
D. Blachier,
2011
.
O. Faynot,
J. Pelloie,
C. Fenouillet-Béranger,
2001,
2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207).
G. Molas,
L. Perniola,
B. De Salvo,
2008,
2008 IEEE International Electron Devices Meeting.
J. Nodin,
A. Toffoli,
H. Grampeix,
2011,
2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
L. Perniola,
B. De Salvo,
P. Scheiblin,
2007,
2007 IEEE International Electron Devices Meeting.
B. Previtali,
F. Nemouchi,
P. Rodriguez,
2017
.
A. Toffoli,
S. Maitrejean,
L. Perniola,
2011,
2011 IEEE International Interconnect Technology Conference.
L. Perniola,
B. De Salvo,
P. Scheiblin,
2006,
2006 International Conference on Simulation of Semiconductor Processes and Devices.
L. Perniola,
P. Scheiblin,
G. Reimbold,
2006
.
O. Faynot,
J. Hartmann,
L. Tosti,
2005
.
E. Souchier,
A. Roule,
S. Maitrejean,
2012,
2012 International Electron Devices Meeting.
F. Aussenac,
Gabriele Navarro,
Barbara De Salvo,
2012,
Microelectron. Reliab..
J. Hartmann,
L. Clavelier,
G. Rolland,
2004
.
J. Nodin,
O. Cueto,
A. Roule,
2012,
2012 IEEE International Interconnect Technology Conference.
E. Vianello,
G. Navarro,
F. Aussenac,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
A. Toffoli,
A. Roule,
S. Maitrejean,
2012
.
High Density Embedded PCM Cell in 28nm FDSOI Technology for Automotive Micro-Controller Applications
P. Mattavelli,
P. Cappelletti,
O. Kermarrec,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
O. Faynot,
S. Cristoloveanu,
M. Gaillardin,
2007,
IEEE Transactions on Nuclear Science.
O. Faynot,
M. Gaillardin,
L. Tosti,
2005,
IEEE Transactions on Nuclear Science.
G. Reimbold,
D. Blachier,
A. Toffoli,
2010,
2010 International Electron Devices Meeting.
G. Reimbold,
D. Blachier,
A. Toffoli,
2010,
2010 Proceedings of the European Solid State Device Research Conference.
G. Reimbold,
D. Blachier,
A. Toffoli,
2010,
2010 IEEE International Memory Workshop.
G. Molas,
E. Vianello,
C. Carabasse,
2021,
2021 IEEE International Memory Workshop (IMW).
C. Carabasse,
F. Andrieu,
J. Coignus,
2023,
2023 IEEE International Reliability Physics Symposium (IRPS).
O. Faynot,
S. Cristoloveanu,
M. Gaillardin,
2005,
IEEE Transactions on Nuclear Science.
B. DeSalvo,
Gerard Ghibaudo,
G. Pananakakis,
1999
.
K. Barla,
G. Ghibaudo,
S. Bruyère,
1999
.
P. Mattavelli,
R. Ranica,
P. Boivin,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
O. Faynot,
L. Tosti,
C. Jahan,
2006,
IEEE Transactions on Nuclear Science.