C. Armand

Reduction of boron penetration through thin silicon oxide with a nitrogen doped silicon layer

Pierre Temple-Boyer, Laurent Jalabert, Gérard Sarrabayrouse, 2001, Microelectron. Reliab..

Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses

I. Pianet, F. Voillot, C. Armand, 2010, Microelectron. Reliab..