J. Koomen

Relation between thehot carrier lifetime of transistors and CMOS SRAM products

J. van der Pol, J. Koomen, 1990, 28th Annual Proceedings on Reliability Physics Symposium.

Investigation of the MOST channel conductance in weak inversion

J. Koomen, Jan Koomen, 1973 .

Properties of metre-wavelength solar bursts associated with coronal mass ejections

R. Stewart, R. Robinson, J. Koomen, 1986 .

The measurement of interface state charge in the MOS system

J. Koomen, 1971 .