C. Ng

Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry.

A. Asundi, Lei Huang, C. Ng, 2011, Optics express.

Fast full-field out-of-plane deformation measurement using fringe reflectometry

Anand Asundi, Lei Huang, Chi Seng Ng, 2012 .

Warpage Measurement of Thin Wafers by Reflectometry

Anand Asundi, Chi Seng Ng, A. Asundi, 2011 .

Curvature measurement system of Si-wafer using circular gratings

Anand Asundi, Chi Seng Ng, A. Asundi, 2009, International Conference on Experimental Mechanics.

Stress measurement of thin wafer using reflection grating method

Anand Asundi, Chi Seng Ng, A. Asundi, 2010, Optical Engineering + Applications.

Whole field residual stress measurement using computer aided reflection grating

Anand Asundi, Chi Seng Ng, Yoke Chin Goh, 2008, International Symposium on Laser Metrology.