C. Witt
发表
R. Wiesendanger,
M. Bode,
C. Witt,
1997
.
J. Bonevich,
T. Moffat,
D. Josell,
2004
.
E. T. Ryan,
J. Jordan-Sweet,
M. Toney,
2012
.
J. Jordan-Sweet,
P. Besser,
C. Murray,
2010
.
M. Toney,
P. Besser,
C. Murray,
2010
.
C. Witt,
2000
.
D. Spoddig,
S. Sindermann,
F. Meyer Zu Heringdorf,
2011,
The Review of scientific instruments.
R. Coffee,
Juhao Wu,
K. Sokolowski-Tinten,
2015
.
T. Moffat,
D. Josell,
C. Witt,
2005
.
F. Meyer Zu Heringdorf,
M. Aeschlimann,
C. Witt,
2014,
Plasmonics.
R. Coffee,
K. Sokolowski-Tinten,
H. Dürr,
2016
.
J. Jordan-Sweet,
E. Eisenbraun,
C. Cabral,
2013
.
H. Engelmann,
C. Zistl,
M. Meyer,
2008
.
C. Witt,
C. K. Hu,
G. Bonilla,
2016,
IEEE Transactions on Device and Materials Reliability.
J. Jordan-Sweet,
P. Besser,
C. Murray,
2010
.
J. Jordan-Sweet,
P. Besser,
C. Murray,
2008
.
Jonathan D. Reid,
Eric G. Webb,
C. Witt,
2004
.
C. Child,
P. Periasamy,
C. Witt,
2016,
2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
J. Jordan-Sweet,
R. Rosenberg,
I. C. Noyan,
2011
.
R. Wiesendanger,
M. Bode,
C. Witt,
1996
.
P. Ho,
C. Labelle,
B. Taylor,
2015
.
T. Moffat,
D. Wheeler,
D. Josell,
2003
.
T. Moffat,
D. Wheeler,
D. Josell,
2002
.
V. Sessi,
T. Michely,
S. Schumacher,
2014,
1409.4272.
Z. Tokei,
I. Ciofi,
N. Jordán,
2018,
2018 IEEE International Interconnect Technology Conference (IITC).
E. Arzt,
C. Volkert,
C. Witt,
2003
.
M. Ritala,
M. Leskelä,
T. Aaltonen,
2006
.
E. T. Ryan,
J. Jordan-Sweet,
M. Toney,
2012,
Powder Diffraction.
T. Moffat,
D. Wheeler,
D. Josell,
2002
.
T. Moffat,
D. Wheeler,
D. Josell,
2003
.
C. Cabral,
C. Lavoie,
J. Newbury,
2013,
IEEE Electron Device Letters.
C. Witt,
E. Webb,
J. Reid,
2002,
Proceedings of the IEEE 2002 International Interconnect Technology Conference (Cat. No.02EX519).
C. Witt,
K. Pfeifer,
2003
.
L. Gignac,
H. Miyazoe,
D. Klaus,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
S. Sindermann,
M. Aeschlimann,
C. Witt,
2018,
Plasmonics.
T. Moffat,
D. Josell,
C. Witt,
2006
.