Kenneth P. Parker

发表

Kenneth P. Parker, 1992 .

Stig Oresjo, Kenneth P. Parker, John E. McDermid, 1993, Proceedings of IEEE International Test Conference - (ITC).

Kenneth P. Parker, 2002, Proceedings. International Test Conference.

Neil G. Jacobson, Kenneth P. Parker, 2008, 2008 IEEE International Test Conference.

Edward J. McCluskey, Kenneth P. Parker, E. McCluskey, 1975, IEEE Transactions on Computers.

Kenneth P. Parker, Thomas Walter Williams, 1992 .

Kenneth P. Parker, 2016 .

C. J. Clark, Kenneth P. Parker, Dave Dubberke, 2010, 2010 IEEE International Test Conference.

Kenneth P. Parker, 2016 .

Xin He, Anura P. Jayasumana, Yashwant K. Malaiya, 2009, 2009 International Test Conference.

Kenneth P. Parker, K. Parker, 2003, IEEE Des. Test Comput..

Thomas W. Williams, Kenneth P. Parker, 1979, Computer.

Kenneth P. Parker, Bill Follis, Kathy Hird, 2002, Proceedings. International Test Conference.

Bill Eklow, Kenneth P. Parker, Carl Barnhart, 2003, IEEE Design & Test of Computers.

Bill Eklow, Kenneth P. Parker, Carl Barnhart, 2002, Proceedings. International Test Conference.

Edward J. McCluskey, Kenneth P. Parker, E. McCluskey, 1975, IEEE Transactions on Computers.

Kenneth P. Parker, 2006 .

Kenneth P. Parker, 2016 .

Xin He, Anura P. Jayasumana, Yashwant K. Malaiya, 2010, 2010 IEEE International Test Conference.

Kenneth P. Parker, K. Parker, 1992, Springer US.

Kenneth P. Parker, Dayton Norrgard, 2008, 2008 IEEE International Test Conference.

Kenneth P. Parker, 2004, 2004 International Conferce on Test.

Kenneth P. Parker, Kenneth E Posse, 1994 .

Kenneth P. Parker, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Kenneth P. Parker, 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

Mick Tegethoff, Ken Lee, Kenneth P. Parker, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Kenneth P. Parker, 2005, IEEE International Conference on Test, 2005..

Kenneth P. Parker, 2005, IEEE International Conference on Test, 2005..

David Greene, Kenneth P. Parker, 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

Kenneth P. Parker, 2016 .

Kenneth P. Parker, 2016 .

Akira Matsuzawa, Kenneth P. Parker, Rodney A. Browen, 1997 .

Kenneth P. Parker, 2010, 2010 IEEE International Test Conference.

Kenneth P. Parker, 1994, Proceedings., International Test Conference.

Stig Oresjo, Kenneth P. Parker, 1990, Proceedings. International Test Conference 1990.

Kenneth P. Parker, 2016 .

Akira Matsuzawa, Kenneth P. Parker, John E. McDermid, 1997, Proceedings International Test Conference 1997.

Kenneth P. Parker, 1995 .

Kenneth P. Parker, 2016 .

Thomas W. Williams, Kenneth P. Parker, K. Parker, 1982, IEEE Trans. Computers.

Kenneth P. Parker, Don DeMille, 2007, 2007 IEEE International Test Conference.

Kenneth P. Parker, 1992 .

Mick Tegethoff, Kenneth P. Parker, 1995, IEEE Des. Test Comput..

Kenneth P. Parker, 2016 .

Kenneth P. Parker, 2016 .

Jeff Rearick, Kenneth P. Parker, Young Kim, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

Kenneth P. Parker, Kenneth E Posse, 1995 .

Kenneth P. Parker, 2016 .

Kenneth P. Parker, 1976 .

Kenneth P. Parker, Jeff Burgess, 2009, 2009 International Test Conference.

Kenneth P. Parker, 2012, 2012 IEEE International Test Conference.

Kenneth P. Parker, 2004, 2004 International Conferce on Test.

Kenneth P. Parker, Andedward J. McCLUSKEY, 1974 .

Stephen K. Sunter, Kenneth P. Parker, 2009, 2009 International Test Conference.

Kenneth P. Parker, Stephen Hird, 2007, 2007 IEEE International Test Conference.

Kenneth P. Parker, 2016 .

Kenneth P. Parker, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Kenneth P. Parker, Dan Zimmerle, 2002 .

Edward J. McCluskey, John J. Shedletsky, Kenneth P. Parker, 1978, IEEE Transactions on Computers.

Kenneth P. Parker, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Stig Oresjo, Kenneth P. Parker, 1991, J. Electron. Test..

Shuichi Kameyama, Kenneth P. Parker, David Dubberke, 2011, 2011 IEEE International Test Conference.