Hokyung Park
发表
K. Saraswat,
D. Gilmer,
G. Bersuker,
2009,
2009 International Symposium on VLSI Technology, Systems, and Applications.
H. Hwang,
M. Jo,
B. Lee,
2009
.
H. Hwang,
Tae-Wook Kim,
M. Jo,
2008,
IEEE Electron Device Letters.
M. Shur,
G. Bersuker,
D. Veksler,
2011
.
L. Larcher,
A. Padovani,
D. Linten,
2019
.
L. Larcher,
A. Padovani,
D. Linten,
2019,
IEEE Transactions on Electron Devices.
H. Hwang,
Seungjae Jung,
Hyejung Choi,
2007
.
H. Hwang,
M. Jo,
Seungjae Jung,
2007
.
Jae Kyeong Jeong,
R. Choi,
C. Choi,
2011
.
Chang Seo Park,
H. Hwang,
M. Jo,
2008
.
H. Hwang,
H. Sim,
Jinho Ahn,
2006
.
H. Hwang,
M. Hasan,
Hokyung Park,
2007
.
H. Hwang,
M. Hasan,
Hokyung Park,
2007
.
L. Larcher,
A. Padovani,
G. Bersuker,
2011
.
H. Hwang,
M. Jo,
Seungjae Jung,
2007
.
H. Hwang,
M. Jo,
Man Chang,
2007
.
H. Hwang,
M. Jo,
B. Lee,
2007,
IEEE Electron Device Letters.
H. Hwang,
S. Jeon,
Sangmoo Choi,
2004
.
B. Lee,
Ho-In Lee,
Young Gon Lee,
2021,
IEEE Journal of the Electron Devices Society.
Jack C. Lee,
Manhong Zhang,
C. Kang,
2006,
2006 64th Device Research Conference.
H. Hwang,
Jong-Ho Lee,
M. Hasan,
2007
.
H. Hwang,
Dongsoo Lee,
Sangmoo Choi,
2005
.
H. Hwang,
S. Nam,
H. Chang,
2004
.
H. Hwang,
M. Jo,
Jong-Ho Lee,
2007
.
L. Larcher,
A. Padovani,
G. Bersuker,
2011
.
H. Hwang,
G. Bersuker,
P. Kirsch,
2007
.
M. Hussein,
G. Bersuker,
K. Matthews,
2010,
IEEE Electron Device Letters.
Effect of Oxygen Postdeposition Annealing on Bias Temperature Instability of Hafnium Silicate MOSFET
H. Hwang,
M. Jo,
Jang-Sik Lee,
2008,
IEEE Electron Device Letters.