Mohsen Raji
发表
Hossein Pedram,
Behnam Ghavami,
Mohsen Raji,
2015,
IET Comput. Digit. Tech..
Mohsen Raji,
B. Ghavami,
2020,
Soft Error Reliability of VLSI Circuits.
Mohsen Raji,
B. Ghavami,
2020,
Soft Error Reliability of VLSI Circuits.
Failure Characterization of Carbon Nanotube FETs Under Process Variations: Technology Scaling Issues
Mohsen Raji,
B. Ghavami,
2016,
IEEE Transactions on Device and Materials Reliability.
Mohsen Raji,
H. Pedram,
B. Ghavami,
2011,
Nanotechnology.
Mohsen Raji,
B. Ghavami,
2016,
Journal of Electronic Testing.
Mohsen Raji,
Farshad Khunjush,
Arash Qodratnama,
2021,
Microelectron. J..
Hossein Pedram,
Mehdi Baradaran Tahoori,
Behnam Ghavami,
2013,
JETC.
Behnam Ghavami,
Mohsen Raji,
Atousa Jafari,
2020,
IEEE Transactions on Circuits and Systems I: Regular Papers.
Hossein Pedram,
Behnam Ghavami,
Mohsen Raji,
2015,
Microelectron. Reliab..
Hossein Pedram,
Alireza Tajary,
Behnam Ghavami,
2011,
Des. Autom. Embed. Syst..
Hossein Pedram,
Massoud Pedram,
Behnam Ghavami,
2013,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Hossein Pedram,
Behnam Ghavami,
Mohsen Raji,
2011,
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.
Hossein Pedram,
Behnam Ghavami,
Mohsen Raji,
2011,
2011 IEEE Computer Society Annual Symposium on VLSI.
Hossein Pedram,
Behnam Ghavami,
Mohsen Raji,
2011,
2011 12th International Symposium on Quality Electronic Design.
Behnam Ghavami,
Lesley Shannon,
Mohsen Raji,
2020,
2020 IEEE/ACM International Conference On Computer Aided Design (ICCAD).
Behnam Ghavami,
Mohsen Raji,
M. Amin Sabet,
2019,
IEEE Access.
Mohsen Raji,
B. Ghavami,
2021
.
Behnam Ghavami,
Mohsen Raji,
Ali Mahani,
2020,
Integr..
Behnam Ghavami,
Mohsen Raji,
Mohammad Reza Rohanipoor,
2017,
Microelectron. J..
Behnam Ghavami,
Mohsen Raji,
Mohammad Reza Rohanipoor,
2020,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Reza Mahmoudi,
Behnam Ghavami,
Mohsen Raji,
2021,
IEEE Access.
Behnam Ghavami,
Mohsen Raji,
M. Amin Sabet,
2018,
IEEE Design & Test.
Behnam Ghavami,
Mohsen Raji,
Mohsen Raji,
2017,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Mohsen Raji,
B. Ghavami,
A. Jafari,
2021,
IEEE transactions on device and materials reliability.
Behnam Ghavami,
Mohsen Raji,
Mohsen Raji,
2016,
J. Electron. Test..
Mohsen Raji,
B. Ghavami,
Mohammadamin Baghbanbashi,
2023,
2023 28th International Computer Conference, Computer Society of Iran (CSICC).
SeaPlace: Process Variation Aware Placement for Reliable Combinational Circuits against SETs and METs
pdf
Hossein Pedram,
Behnam Ghavami,
Lesley Shannon,
2021,
ArXiv.