T. Ueda

Effect of Interface Buffer Layer on the Reliability of Ultra-Thin MgO Magnetic Tunnel Junctions for Spin Transfer Switching MRAM

A. Nitayama, N. Shimomura, S. Ikegawa, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

Estimation of spin transfer torque effect and thermal activation effect on magnetization reversal in CoFeB∕MgO∕CoFeB magnetoresistive tunneling junctions

Hiroaki Yoda, Naoharu Shimomura, Tatsuya Kishi, 2007 .

Bit yield improvement by precise control of stray fields from SAF pinned layers for high-density MRAMs

Hiroaki Yoda, Hiromitsu Hada, S. Tahara, 2005 .

Process Integration of Low-Power and High-Speed 16Mb MRAM using Multi-Layer Wiring Technology

S. Miura, Akihiro Nitayama, Hiroaki Yoda, 2006 .

Effect of Self-Heating on Time-Dependent Dielectric Breakdown in Ultrathin MgO Magnetic Tunnel Junctions for Spin Torque Transfer Switching Magnetic Random Access Memory

Makoto Nagamine, Keiji Hosotani, A. Nitayama, 2010 .

Effect of novel yoke wire in low-power MRAM applications

Hiroaki Yoda, Shuichi Tahara, Tatsuya Kishi, 2004 .