S. Takahashi

Effect of Interface Buffer Layer on the Reliability of Ultra-Thin MgO Magnetic Tunnel Junctions for Spin Transfer Switching MRAM

A. Nitayama, N. Shimomura, S. Ikegawa, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

Spin-RAM for Normally-Off Computer

S. Yuasa, A. Fukushima, Y. Nakatani, 2011, 2011 11th Annual Non-Volatile Memory Technology Symposium Proceeding.