D. Becher
发表
M. Feng,
R. Chan,
R. Lesnick,
2003
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Predictive compact modeling of NQS effects and thermal noise in 90nm mixed-signal/RF CMOS technology
S. Mudanai,
Wei-Kai Shih,
P. Packan,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
D. Becher,
M. Feng,
D. Becher,
1999,
IEEE Electron Device Letters.
S. Natarajan,
M. D. Giles,
S. Mudanai,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
M. D. Giles,
S. Mudanai,
K. J. Kuhn,
2011,
IEEE Transactions on Electron Devices.
G. Stillman,
R. Dupuis,
H. Kuo,
1999
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G. Stillman,
R. Dupuis,
H. Kuo,
1998
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M. M. Wong,
R. Dupuis,
M. Feng,
2002
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Milton Feng,
D. Becher,
R. Chan,
2002
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M. Agostinelli,
S. Natarajan,
S. Ramey,
2015,
2015 IEEE International Reliability Physics Symposium.
P. Packan,
M. Hattendorf,
I. Post,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
Milton Feng,
Shyh-Chiang Shen,
JianJang Huang,
2000,
2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017).