Seyab Khan

Incorporating parameter variations in BTI impact on nano-scale logical gates analysis

Francky Catthoor, Said Hamdioui, Praveen Raghavan, 2012, 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

NBTI-Aware Nanoscaled Circuit Delay Assessment and Mitigation

S. Hamdioui, Seyab Khan, 2011 .

NBTI Monitoring and Design for Reliability in Nanoscale Circuits

Francky Catthoor, Said Hamdioui, Nor Zaidi Haron, 2011, 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.

BTI impact on logical gates in nano-scale CMOS technology

Francky Catthoor, Said Hamdioui, Praveen Raghavan, 2012, 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

Francky Catthoor, Guido Groeseneken, Said Hamdioui, 2014, IEEE Transactions on Device and Materials Reliability.

Bias temperature instability analysis in SRAM decoder

Francky Catthoor, Said Hamdioui, Praveen Raghavan, 2013, 2013 18th IEEE European Test Symposium (ETS).

Bias Temperature Instability analysis of FinFET based SRAM cells

Francky Catthoor, Said Hamdioui, Ben Kaczer, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Modeling and mitigating NBTI in nanoscale circuits

Said Hamdioui, Seyab Khan, S. Hamdioui, 2011, 2011 IEEE 17th International On-Line Testing Symposium.

EFFECTIVENESS OF SCLEROMETER TEST TECHNIQUE ON STRENGTH ASSESSMENT OF HIGH PERFORMANCE CONCRETE

Jamaloddin Noorzaei, Mohd Razali Abdul Kadir, M. S. Jaafar, 2004 .