D. Cooper

发表

Anomalous Resistance Hysteresis in Oxide ReRAM: Oxygen Evolution and Reincorporation Revealed by In Situ TEM

R. Dittmann, S. Menzel, A. Marchewka, 2017, Advanced materials.

Off-axis electron holography for the direct visualization of perpendicular shape anisotropy in nanoscale 3D magnetic random-access-memory devices

B. Diény, T. Almeida, I. Prejbeanu, 2022, APL Materials.

Thermally propagated Al contacts on SiGe nanowires characterized by electron beam induced current in a scanning transmission electron microscope

E. Monroy, G. Moldovan, P. Gentile, 2021, Nanotechnology.

Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy.

B. Haas, R. Berthier, J. Rouviere, 2019, Ultramicroscopy.

Improved measurement of electric fields by nanobeam precession electron diffraction

S. Martinie, J. Rouviere, D. Cooper, 2020, Journal of Applied Physics.

An electron holography study of perpendicular magnetic tunnel junctions nanostructured by deposition on pre-patterned conducting pillars.

B. Diény, L. Vila, R. Sousa, 2020, Nanoscale.

Off-axis electron holography combining summation of hologram series with double-exposure phase-shifting: Theory and application.

D. Cooper, V. Boureau, R. McLeod, 2018, Ultramicroscopy.

Determination of the internal piezoelectric potentials and indium concentration in InGaN based quantum wells grown on relaxed InGaN pseudo-substrates by off-axis electron holography

A. Dussaigne, D. Cooper, V. Boureau, 2020, Nanotechnology.

Off-Axis Electron Holography for Field Mapping in the Semiconductor Industry

P. Bayle-Guillemaud, J. Rouviere, M. D. Hertog, 2010 .

Mapping of the electrostatic potentials in MOCVD and hybrid GaN tunnel junctions for InGaN/GaN blue emitting light emitting diodes by off-axis electron holography correlated with structural, chemical, and optoelectronic characterization

B. Damilano, N. Rochat, G. Feuillet, 2021, Journal of Applied Physics.

Correlative investigation of Mg doping in GaN layers grown at different temperatures by atom probe tomography and off-axis electron holography

P. Jouneau, C. Bougerol, P. Vennégués, 2019, Nanotechnology.

Active Dopant Profiling in the TEM by Off‐Axis Electron Holography

D. Cooper, 2013 .

Electron beam induced current microscopy of silicon p–n junctions in a scanning transmission electron microscope

E. Monroy, G. Moldovan, D. Cooper, 2021 .

Quantitative Visualization of Thermally Enhanced Perpendicular Shape Anisotropy STT-MRAM Nanopillars.

B. Diény, T. Almeida, R. Sousa, 2022, Nano letters.

Electronic Transport on W-Rich Films Deposited by Focused Ion Beam

R. Berthier, G. Audoit, D. Cooper, 2017, Journal of Superconductivity and Novel Magnetism.

Quantitative Mapping of the Charge Density in a Monolayer of MoS2 at Atomic Resolution by Off-Axis Electron Holography.

B. Sklénard, A. Kis, D. Dumcenco, 2019, ACS nano.

Thermal robustness of magnetic tunnel junctions with perpendicular shape anisotropy.

B. Diény, L. Vila, L. Buda-Prejbeanu, 2020, Nanoscale.

The Photonic Atom Probe as a Tool for the Analysis of the Effect of Defects on the Luminescence of Nitride Quantum Structures

E. Monroy, N. Rochat, A. Grenier, 2023, Microscopy and Microanalysis.

Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction

E. Monroy, S. Vézian, B. Damilano, 2020, Nanotechnology.

Three-dimensional measurement of Mg dopant distribution and electrical activity in GaN by correlative atom probe tomography and off-axis electron holography

P. Jouneau, C. Bougerol, A. Dussaigne, 2020, Journal of Applied Physics.

Off-axis electron holography for the measurement of active dopants in silicon semiconductor devices

D. Cooper, David Cooper, 2016 .

TEM specimen preparation by Au+, Ga+, Si+ and Si++ focused ion beams for off-axis electron holography

F. Bertin, G. Benassayag, D. Cooper, 2010 .

Quantitative off‐axis electron holography of GaAs p‐n junctions prepared by focused ion beam milling

P. Midgley, R. Truche, R. Dunin‐Borkowski, 2009, Journal of microscopy.

Dopant Profiling in the TEM: Progress Towards Quantitative Electron Holography

P. Midgley, R. Dunin‐Borkowski, A. C. Twitchett, 2008 .

Advanced Focused Ion Beam Specimen Preparation for Examination by Off-Axis Electron Holography

P. Midgley, R. Dunin‐Borkowski, D. Cooper, 2008 .

Off-axis electron holography of focused ion beam milled GaAs and Si p-n junctions

P. Midgley, D. Ritchie, I. Farrer, 2005 .

Electron holography of doped semiconductors: when does it work and is it quantitative?

P. Midgley, M. McCartney, T. Kasama, 2005 .

Highly spatially resolved mapping of the piezoelectric potentials in InGaN quantum well structures by off-axis electron holography

D. Cooper, V. Boureau, David Cooper, 2020 .

Fine electron biprism on a Si-on-insulator chip for off-axis electron holography.

G. Pozzi, M. Duchamp, R. Dunin‐Borkowski, 2018, Ultramicroscopy.

Inversion of the Internal Electric Field due to Inhomogeneous Incorporation of Ge Dopants in GaN/AlN Heterostructures Studied by Off-Axis Electron Holography.

E. Monroy, D. Cooper, Lou Denaix, 2023, ACS applied materials & interfaces.

Blue to yellow emission from (Ga,In)/GaN quantum wells grown on pixelated silicon substrate

M. Portail, B. Damilano, V. Brändli, 2020, Scientific Reports.

Direct measurement of TEM lamella thickness in FIB-SEM.

S. Haigh, D. Cooper, A. Rakowski, 2019, Journal of microscopy.

Mapping of the Electrostatic Potentials in a Fully Processed Led Device with nm-Scale Resolution by In Situ off-Axis Electron Holography.

C. Licitra, D. Cooper, B. Masenelli, 2023, Small methods.

In-Situ EBIC STEM: Automated Quantification

G. Moldovan, D. Cooper, A. Conlan, 2022, Microscopy and Microanalysis.

Direct observation of the perpendicular shape anisotropy and thermal stability of p-STT-MRAM nano-pillars

B. Diény, T. Almeida, R. Sousa, 2022, 2202.01065.