V. Astakhov

Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images

T. Deerinck, Mark Ellisman, E. Bushong, 2016, Advanced Structural and Chemical Imaging.

Structural inhomogeneities in gallium arsenide epitaxial layers

V. Astakhov, V. M. Zaletin, S. Stenin, 1976 .

Electron Beam Induced Changes of the Real Structure of Semiconductors

D. Hoehl, O. Pchelyakov, J. Heydenreich, 1979 .

Micromorphology and defects of non‐doped gallium arsenide layers

V. Astakhov, V. M. Zaletin, A. Toropov, 1978 .