Ashwath Rao

发表

Electrical characterization of MFeOS gate stacks for ferroelectric FETs

Atul Kumar, M. Goswami, Ashwath Rao, 2013 .

Influence of power on the physical and electrical properties of magnetron sputtered gadolinium oxide thin films for MOS capacitors

Ashwath Rao, G. Arun Kumar Thilipan, G. Arun Kumar Thilipan, 2021 .

Electrical characterization of the metal ferroelectric oxide semiconductor and metal ferroelectric nitride semiconductor gate stacks for ferroelectric field effect transistors

R. Verma, Ashwath Rao, Br Singh, 2014 .

Decontamination of sulfur mustard on manganese oxide nanostructures

K. Ganesan, B. Singh, Ashwath Rao, 2007 .

Swift ion irradiation effect on high-k ZrO2- and Al2O3-based MOS devices

Ashwath Rao, P. Chaurasia, B. R. Singh, 2016 .

Radiation Induced Charge Trapping in Sputtered ${\rm ZrO}_{\rm 2} \!\! : \!\! {\rm N}$ Dielectric Thin Films on Silicon

Ashwath Rao, J. Dsa, B. R. Singh, 2014, IEEE Transactions on Nuclear Science.

Battery monitoring system using machine learning

John K. Thomas, Hancy Rohan Crasta, K. Kausthubha, 2021 .

Effect of nitrogen containing plasma on interface properties of sputtered ZrO2 thin films on silicon

M. Goswami, Ashwath Rao, A. Dwivedi, 2014 .

Ionizing radiation effects on electrical and reliability characteristics of sputtered Ta2O5/Si interface

Ashwath Rao, Ankita Verma, B.R. Singh, 2015 .