Un Ki Kim

发表

Effect of high-pressure oxygen annealing on negative bias illumination stress-induced instability of InGaZnO thin film transistors

Jae Kyeong Jeong, H. Hwang, C. Hwang, 2011 .

Double-layered vertically integrated amorphous-In2Ga2ZnO7 thin-film transistor

Jung-Hae Choi, Cheol Seong Hwang, C. Hwang, 2013 .

Vertically integrated submicron amorphous-In2Ga2ZnO7 thin film transistor using a low temperature process

C. Hwang, S. Rha, T. Park, 2012 .

The impact of orbital hybridization on the electronic structure of crystalline InGaZnO: a new perspective on the compositional dependence

C. Hwang, Seungwu Han, D. Cho, 2014 .

Dynamics of negative bias thermal stress-induced threshold voltage shifts in indium zinc oxide transistors: impact of the crystalline structure on the activation energy barrier

Jae Kyeong Jeong, H. Kim, Sungmin Kim, 2014 .

Study on the defects in metal–organic chemical vapor deposited zinc tin oxide thin films using negative bias illumination stability analysis

Jeong Hwan Kim, C. Hwang, Joohwi Lee, 2013 .

The effects of device geometry on the negative bias temperature instability of Hf-In-Zn-O thin film transistors under light illumination

Jeong Hwan Kim, Jae Kyeong Jeong, C. Hwang, 2011 .

Suppression in the negative bias illumination instability of Zn-Sn-O transistor using oxygen plasma treatment

Jin Jang, Chi-Sun Hwang, Shinhyuk Yang, 2011 .

Improvement in the negative bias illumination temperature stress instability of In–Ga–Zn–O thin film transistors using an Al2O3 buffer layer

Jeong Hwan Kim, C. S. Hwang, Jeong hwan Kim, 2011 .

Indium tin oxide/InGaZnO bilayer stacks for enhanced mobility and optical stability in amorphous oxide thin film transistors

Cheol Seong Hwang, Yoon Jang Chung, C. Hwang, 2014 .

Resistive Switching in $\hbox{TiO}_{2}$ Thin Films Using the Semiconducting In-Ga-Zn-O Electrode

Jeong Hwan Kim, Jun Yeong Seok, C. Hwang, 2012, IEEE Electron Device Letters.

Direct Observation of Hole Current in Amorphous Oxide Semiconductors under Illumination

Jeong Hwan Kim, Cheol Seong Hwang, Jae Kyeong Jeong, 2011 .

Bias Temperature Instability Characteristics of n- and p-Type Field Effect Transistors Using HfO2 Gate Dielectrics and Metal Gate

Jeong Hwan Kim, Sang Young Lee, Cheol Seong Hwang, 2010 .

Theoretical and experimental studies on the electronic structure of crystalline and amorphous ZnSnO3 thin films

C. Hwang, D. Cho, Joohwi Lee, 2013 .

Improved Growth and Electrical Properties of Atomic-Layer-Deposited Metal-Oxide Film by Discrete Feeding Method of Metal Precursor

Jeong Hwan Kim, Jae Hyuck Jang, C. Hwang, 2011 .

Optical modeling and experimental verification of light induced phenomena in In-Ga-Zn-O thin film transistors with varying gate insulator thickness

Jeong Hwan Kim, C. Hwang, Jeong hwan Kim, 2012 .

Spectroscopic investigation of the hole states in Ni-deficient NiO films

C. Hwang, K. Kim, D. Cho, 2013 .

Optimized Electrical Properties and Chemical Structures of SrTiO3 Thin Films on Si Using Various Interfacial Barrier Layers

Jeong Hwan Kim, Jae Hyuck Jang, C. Hwang, 2010 .

Study on the Existence of Abnormal Hysteresis in Hf-In-Zn-O Thin Film Transistors under Illumination

Jeong Hwan Kim, C. Hwang, Sangyoon Lee, 2011 .

Correlation of the change in transfer characteristics with the interfacial trap densities of amorphous In–Ga–Zn–O thin film transistors under light illumination

Jeong Hwan Kim, C. Hwang, Un Ki Kim, 2011 .

Performance Variation According to Device Structure and the Source/Drain Metal Electrode of a-IGZO TFTs

C. Hwang, S. Rha, T. Park, 2012, IEEE Transactions on Electron Devices.

Variation in the threshold voltage of amorphous-In2Ga2ZnO7 thin-film transistors by ultrathin Al2O3 passivation layer

C. Hwang, Seung Jun Lee, S. Rha, 2013 .

The charge trapping characteristics of Si3N4 and Al2O3 layers on amorphous-indium-gallium-zinc oxide thin films for memory application

C. Hwang, S. Rha, Un Ki Kim, 2012 .

Spectroscopic Investigation on the Origin of Photoinduced Carrier Generation in Semiconducting InGaO and InGaZnO Films

Jeong Hwan Kim, C. Hwang, D. Cho, 2010 .

Improvement in Photo-Bias Stability of High-Mobility Indium Zinc Oxide Thin-Film Transistors by Oxygen High-Pressure Annealing

Jae Kyeong Jeong, C. Hwang, R. Choi, 2013, IEEE Electron Device Letters.

The Electrical Properties of Asymmetric Schottky Contact Thin-Film Transistors with Amorphous-$\hbox{In}_{2}\hbox{Ga}_{2}\hbox{ZnO}_{7}$

C. Hwang, S. Rha, Un Ki Kim, 2013, IEEE Transactions on Electron Devices.