S. Lariviere
发表
M. H. van der Veen,
J. Bekaert,
K. Croes,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
G. U'ren,
J. Gambino,
C. Christiansen,
2014,
2014 IEEE International Reliability Physics Symposium.
Christopher J. Wilson,
Michele Stucchi,
Zsolt Tokei,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
S. Decoster,
J. Ryckaert,
K. Croes,
2017,
2017 IEEE International Interconnect Technology Conference (IITC).
N. Jourdan,
T. Tabata,
F. Mazzamuto,
2020,
2020 IEEE International Interconnect Technology Conference (IITC).