F. Caignet
发表
Jean-Yves Fourniols,
Matteo Rocca,
F. Caignet,
1998
.
F. Caignet,
Etienne Sicard,
S. Delmas-Bendhia,
2000
.
F. Caignet,
N. Nolhier,
M. Bafleur,
2011,
10th International Symposium on Electromagnetic Compatibility.
F. Caignet,
S. Delmas Bendhia,
E. Sicard,
2000,
Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474).
F. Caignet,
N. Nolhier,
M. Bafleur,
2014,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014.
F. Caignet,
Etienne Sicard,
S. Delmas-Bendhia,
1999
.
F. Caignet,
Etienne Sicard,
S. Delmas-Bendhia,
2001,
Proc. IEEE.
F. Caignet,
G. Duchamp,
2017
.
F. Caignet,
Etienne Sicard,
S.D.-B. Dhia,
2000,
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).
F. Caignet,
N. Nolhier,
M. Bafleur,
2012,
2012 Asia-Pacific Symposium on Electromagnetic Compatibility.
F. Caignet,
F. Sellaye,
J. Collet,
2002,
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects.
F. Caignet,
E. Sicard,
R. De Smedt,
1999,
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261).
F. Caignet,
S. Delmas Bendhia,
E. Sicard,
1998,
Proceedings of the 1998 Second IEEE International Caracas Conference on Devices, Circuits and Systems. ICCDCS 98. On the 70th Anniversary of the MOSFET and 50th of the BJT. (Cat. No.98TH8350).
F. Caignet,
C. Baron,
J.-C. Geffroy,
1998
.
F. Caignet,
N. Nolhier,
F. Lafon,
2011,
EOS/ESD Symposium Proceedings.
F. Caignet,
Etienne Sicard,
S. Delmas-Bendhia,
2000
.
F. Caignet,
N. Nolhier,
M. Bafleur,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
F. Caignet,
N. Nolhier,
M. Bafleur,
2012,
IEEE Transactions on Device and Materials Reliability.
F. Caignet,
R. Perdriau,
A. Alaeldine,
2007,
2007 IEEE International Symposium on Electromagnetic Compatibility.
F. Caignet,
N. Nolhier,
M. Bafleur,
2013,
IEEE Transactions on Electromagnetic Compatibility.