J. Wolstenholme

发表

An Introduction to Surface Analysis by XPS and AES

J. Watts, J. Wolstenholme, 1990 .

Effective attenuation length of Al Kα-excited Si2p photoelectrons in SiO2, Al2O3 and HfO2 thin films

H. Bender, T. Conard, J. Pireaux, 2005 .

Electrochemical methods of assessing the corrosion of painted metals—a review

J. Wolstenholme, 1973 .

Surface coverage measurements by sims for CO adsorption on a number of metals and for CO and H2S CO-adsorption on Ni(110), (100) and (111)

R. Bordoli, J. Vickerman, J. Wolstenholme, 1979 .

The application of SIMS to the study of CO adsorption on polycrystalline metal surfaces

J. Vickerman, J. Wolstenholme, M. Barber, 1977 .

Non‐destructive analysis of ultrathin dielectric films

P. Mack, R. White, J. Wolstenholme, 2003 .

The use of angle resolved XPS to measure the fractional coverage of high- k dielectric materials on silicon and silicon dioxide surfaces

T. Conard, P. Mack, R. White, 2006 .

Secondary ion mass spectra of some simple organic molecules

John C. Vickerman, M. Barber, J. Vickerman, 1980 .

Report on the 47th IUVSTA Workshop ‘Angle‐Resolved XPS: the current status and future prospects for angle‐resolved XPS of nano and subnano films’

R. Opila, H. Nohira, R. Wallace, 2009 .

Secondary Ion Mass Spectrometry

J. Watts, J. Wolstenholme, R. Webb, 2012 .

X-ray photoelectron spectroscopy characterisation of high-k dielectric Al2O3 and HfO2 layers deposited on SiO2/Si surface

H. Bender, T. Conard, J. Pireaux, 2004 .

Influence of morphology on the stability of LiNiO2

J. Currie, J. Wolstenholme, Wu Li, 1997 .

Inexpensive Meter for Corrosion Potential Measurements

J. Wolstenholme, 1975 .

Approaches to analyzing insulators with Auger electron spectroscopy: Update and overview

M. Seah, D. Baer, L. Kövér, 2010 .

Summary of ISO/TC 201 Standard: XXX. ISO 18516: 2006—Surface chemical analysis—Auger electron spectroscopy and X‐ray photoelectron spectroscopy—Determination of lateral resolution

J. Wolstenholme, 2008 .

Anti-corrosion properties of zinc dust paints

T. K. Ross, J. Wolstenholme, 1977 .

Summary of ISO/TC 201 Standard: XXX. ISO 18516: 2006—Surface chemical analysis—Auger electron spectroscopy and X‐ray photoelectron spectroscopy—Determination of lateral resolution

J. Wolstenholme, 2008 .

Depth-Resolved Composition and Chemistry of Ultra-Thin Films by Angle-Resolved X-Ray Photoelectron Spectroscopy

C. R. Brundle, P. Mack, G. Conti, 2005 .

Studies of adsorption and surface reactivity of metals by secondary ion mass spectrometry: II. Adsorption of ethylene on nickel

M. Barber, J. Vickerman, J. Wolstenholme, 1976 .

Adsorption and surface reactivity of metals by secondary ion mass spectrometry. Part 1.—Adsorption of carbon monoxide on nickel and copper

M. Barber, J. Vickerman, J. Wolstenholme, 1976 .