P. Streubel

发表

Error estimation in peak‐shape analysis of XPS core‐level spectra using UNIFIT 2003: how significant are the results of peak fits?

T. Chassé, R. Hesse, P. Streubel, 2004 .

Product or sum: comparative tests of Voigt, and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt‐based X‐ray photoelectron spectra

R. Hesse, P. Streubel, R. Szargan, 2007 .

The Relaxation of Photoelectron and Auger Energies in Solid Phosphorus Compounds

R. Franke, T. Chassé, P. Streubel, 1992 .

Improved peak-fit procedure for XPS measurements of inhomogeneous samples—Development of the advanced Tougaard background method

R. Denecke, R. Hesse, P. Streubel, 2015 .

Luminescence of (GaAl)As layers grown by temperature gradient liquid phase epitaxy

A. Zehe, P. Streubel, G. Kühn, 1975 .

Change of chemical bonding of nitrogen of polymeric N-heterocyclic compounds during pyrolysis

R. Hesse, P. Streubel, H. Schmiers, 1999 .

Relaxation energies in XPS and XAES of solid sulfur compounds

H. Peisert, T. Chassé, P. Streubel, 1994 .

Auger parameters and relaxation energies of phosphorus in solid compounds

R. Franke, T. Chassé, P. Streubel, 1991 .

Sulfurization of InP(001) surfaces studied by X-ray photoelectron and X-ray induced Auger electron spectroscopies (XPS/XAES)

H. Peisert, T. Chassé, P. Streubel, 1995 .

Chemical Shifts of Auger Electron and Photoelectron Binding Energies of Phosphorus in Solid Compounds

R. Franke, T. Chassé, P. Streubel, 1990 .

A new method for determining relaxation energies by means of aes and xps and its application to silicon compounds

F. Bechstedt, R. Enderlein, P. Streubel, 1983 .

Comparative study of the modelling of the spectral background of photoelectron spectra with the Shirley and improved Tougaard methods

R. Denecke, R. Hesse, P. Streubel, 2013 .

Hard amorphous CSixNy thin films deposited by RF nitrogen plasma assisted pulsed laser ablation of mixed graphite/Si3N4-targets

M. Lorenz, V. Riede, R. Hesse, 1999 .

Lineshape asymmetry parameters in X-ray photoelectron spectra

V. G. Yarzhemsky, T. Reich, P. Streubel, 1996 .

XPS investigation of oxide films on InP(100)

A. Hofmann, P. Streubel, A. Meisel, 1988 .

Mechanical and Chemical Properties of CB x N y and CSi x N y Thin Films Grown by N*-Plasma Assisted Pulsed Laser Deposition

E. Hartmann, M. Lorenz, V. Riede, 1999 .

Interpretation of auger energy shifts of silicon in solid silicon compounds

P. Streubel, A. Reif, R. Fellenberg, 1984 .

X-ray photoelectron spectroscopic core level shifts of phosphorus in phosphates and native oxide layers on InP(100). Applications of the Auger parameter concept

R. Franke, T. Chassé, P. Streubel, 1993 .

A practical method for determining backscattering factors and matrix correction in quantitative aes analysis of binary alloys

P. Streubel, H. Berndt, 1984 .

Characterization of the Diffusion and Rreaction Behaviour of Ti/Pt/Au Layer Contacts on GaAs by Means of Auger Electron Spectroscopy and Ion Sputtering Technique

P. Streubel, A. Meisel, A. Reif, 1990 .

The Interobserver Reliability of Grading of Distal Radius Volar Plate Prominence.

T. Teunis, N. Schep, T. Mittlmeier, 2022, The Journal of hand surgery.

Soft X-ray photoelectron spectroscopy studies of the initial oxidation of AlxGa1-xAs(100) surfaces

A. Hofmann, P. Streubel, A. Meisel, 1990 .

Extended Fenske-Hall LCAO MO calculations of core-level shifts in solid P compounds

R. Franke, T. Chassé, P. Streubel, 1997 .

Information about the Growth Process from Aluminium Concentration Profiles in Ga1−xAlxAs Liquid Phase Epitaxial Layers

P. Streubel, B. Jacobs, E. Butter, 1974 .

Chemical stability of (NH4)2S-passivated InP(001) surfaces – investigations by XPS and XPD

H. Peisert, T. Chassé, P. Streubel, 1997 .

XPS BINDING ENERGIES OF DEEP CORE LEVELS AND THE AUGER PARAMETER - AN APPLICATION TO SOLID SULFUR COMPOUNDS*

H. Peisert, T. Chassé, P. Streubel, 1993 .

Sulfur-modified surface of InP(001): Evidence for sulfur incorporation and surface oxidation

H. Peisert, T. Chassé, A. Chassé, 1997 .

Chemical Shifts of Auger Lines in Solids on the Example of the KL23L23 Transition in Silicon and Its Compounds

P. Streubel, A. Meisel, R. Fellenberg, 1982 .

Chemical bonding studies on UV/ozone- and (NH4)2S-treated InP(001) surfaces by X-ray photoelectron spectroscopy and X-ray induced Auger electron spectroscopy

H. Peisert, T. Chassé, R. Hesse, 1995 .

Improved accuracy of quantitative XPS analysis using predetermined spectrometer transmission functions with UNIFIT 2004

R. Hesse, P. Streubel, R. Szargan, 2005 .

Chemical state information from photoelectron and Auger electron lines - investigation of potential and relaxation effects of solid silicon and phosphorus compounds

R. Franke, T. Chassé, P. Streubel, 1991 .

Approximate Calculation of Inner-Shell Binding Energies and Auger Transition Energies of Solid Silicon Compounds

P. Streubel, J. Reinhold, A. Meisel, 1988 .

The initial oxidation of sputter etched AlxGa1−xAs(100) surfaces investigated by soft X-ray photoelectron spectroscopy

A. Hofmann, P. Streubel, A. Meisel, 1989 .