C. Hsieh

发表

J. Shih, K. F. Yu, M. J. Chen, 2001, 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538).

G. Steward, S. Jungbluth, Huei-Ting Lin, 2017, mBio.

C. Hsieh, Ying-Cheng Chen, J. Ho, 2009, The Review of scientific instruments.