J. W. Park

Prediction of Blank Thickness Variation in a Deep Drawing Process Using Deep Neural Network

Beom-Soo Kang, K. T. Park, J. W. Park, 2020 .

Cost-Effective and Highly Reliable 6F2 Multi-Gigabit DRAM in 60nm Technology Node for Low Power and High Performance Applications

S. H. Jang, Tae-Woo Lee, J. W. Park, 2006 .

DRAM variable retention time

J. W. Park, P. J. Restle, J. W. Park, 1992, 1992 International Technical Digest on Electron Devices Meeting.