E. Pascal

Contour interaction in the presence of congenital nystagmus

E. Pascal, 1991 .

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

M. Kneissl, M. Weyers, P. Parbrook, 2020, Semiconductor Science and Technology.

Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films

M. Kneissl, M. Weyers, Tao Wang, 2019, Photonics Research.

Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

M. Kneissl, M. Weyers, P. Parbrook, 2020, IOP Conference Series: Materials Science and Engineering.

Dislocation contrast in electron channelling contrast images as projections of strain-like components

B. Hourahine, K. Mingard, E. Pascal, 2018 .

Indexing of electron back-scatter diffraction patterns using a convolutional neural network

M. Graef, E. Pascal, Zihao Ding, 2020 .

Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: a Hands-On Tutorial

M. A. Jackson, E. Pascal, M. De Graef, 2019, Integrating Materials and Manufacturing Innovation.