Y. Kiuchi

Calculations of Image Lag in Vidicon-Type Camera Tubes. I. Beam Discharge Lag and Total Image Lag, Including Photoconductive Lag

O. Yoshida, Y. Kiuchi, 1971 .

Characterization of traps at nitrided SiO2/SiC interfaces near the conduction band edge by using Hall effect measurements

D. Okamoto, H. Yano, T. Hatakeyama, 2016, 1703.00615.

Characteristics of experimental CdSe vidicons

K. Shimizu, O. Yoshida, Y. Kiuchi, 1971 .

Characteristics of a New Camera Tube with a CdSe Photoconductive Target

K. Shimizu, Y. Kiuchi, S. Aihara, 1972 .

Characteristics of the New Vidicon-Type Camera Tube Using CdSe as a Target Material

K. Shimizu, Y. Kiuchi, 1967 .

Properties of CdSe-Sb2S3 Vidicon-Type Targets

K. Shimizu, O. Yoshida, Y. Kiuchi, 1968 .

20 kV-Class Ultra-High Voltage 4H-SiC n-IE-IGBTs

M. Sometani, H. Okumura, Tomohisa Kato, 2019 .

Electrical and physical characterizations of the effects of oxynitridation and wet oxidation at the interface of SiO2/4H-SiC(0001) and

K. Fukuda, H. Shiomi, H. Kitai, 2016 .

27.5 kV 4H-SiC PiN diode with space-modulated JTE and carrier injection control

Tsunenobu Kimoto, Koji Nakayama, Yuji Kiuchi, 2018, 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD).