D. Lorenzen

Direct spectroscopic measurement of mounting-induced strain in high-power optoelectronic devices

T. Elsaesser, J. Tomm, R. Müller, 1998 .

Quantitative strain analysis in AlGaAs-based devices

J. Tomm, R. Müller, E. Kaulfersch, 2003 .

Spectroscopic measurement of packaging induced strains in high-power laser diode arrays

T. Elsaesser, H. Reichl, J. Tomm, 1999 .

Packaging and microcooling of high power diode laser bars

P. Koidl, W. Fahrner, E. Kaulfersch, 1998, IECON '98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200).

SPECTROSCOPIC MEASUREMENT OF PACKAGING-INDUCED STRAINS IN QUANTUM-WELL LASER DIODES

Herbert Reichl, D. Lorenzen, Jens W. Tomm, 1999 .