W. Jouha

Silicon Carbide Power MOSFET Model: An Accurate Parameter Extraction Method Based on the Levenberg–Marquardt Algorithm

M. Masmoudi, P. Dherbécourt, A. Oualkadi, 2018, IEEE Transactions on Power Electronics.

An Extraction Method of SiC Power MOSFET Threshold Voltage

P. Dherbécourt, A. El Oualkadi, W. Jouha, 2019, Recent Advances in Electrical and Information Technologies for Sustainable Development.

Failure Analysis of Atmospheric Neutron-Induced Single Event Burnout of a Commercial SiC MOSFET

A. Michez, A. Touboul, J. Boch, 2022, Materials Science Forum.

Dopant activity for highly in-situ doped polycrystalline silicon: hall, XRD, scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy (SSRM)

D. Chateigner, U. Lüders, F. Lallemand, 2021 .

Parametric nano-electrical analysis for SiC junctions of a packaged device

V. Shah, P. Gammon, R. Germanicus, 2022, 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe).

An Improved SPICE Model for the Study of Electro-thermal Static Behavior for two New Generations of SiC MOSFET

M. Masmoudi, P. Dherbécourt, A. Oualkadi, 2019 .

In-depth analysis of the static behaviour of a SiC MOSFET and of its associated parameters using both compact modelling and physical simulation

Ahmed El Oualkadi, Eric Joubert, Mohamed Masmoudi, 2020, IET Circuits Devices Syst..

Repetitive short circuit capability of SiC MOSFET at specific low gate-source voltage bias for more robust extreme operation

F. Richardeau, S. Azzopardi, W. Jouha, 2021, Microelectronics Reliability.

Gate-damage safe failure-mode deep analysis under short-circuit operation of 1.2kV and 1.7kV power SiC MOSFET using dedicated gate-source / drain-source voltage depolarization and damage-mode optical imaging

F. Richardeau, S. Azzopardi, W. Jouha, 2022, 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe).

Towards a safe failure mode under short-circuit operation of power SiC MOSFET using optimal gate source voltage depolarization

F. Richardeau, S. Azzopardi, W. Jouha, 2021, Microelectronics Reliability.