J.-Y. Yeh

A 32nm low power RF CMOS SOC technology featuring high-k/metal gate

J. Rizk, K. Soumyanath, P. VanDerVoorn, 2010, 2010 Symposium on VLSI Technology.

Reliability studies of a 32nm System-on-Chip (SoC) platform technology with 2nd generation high-k/metal gate transistors

M. Agostinelli, G. Curello, H. Deshpande, 2011, 2011 International Reliability Physics Symposium.

RF CMOS technology scaling in High-k/metal gate era for RF SoC (system-on-chip) applications

J. Rizk, K. Soumyanath, P. VanDerVoorn, 2010, 2010 International Electron Devices Meeting.

A 32nm SoC platform technology with 2nd generation high-k/metal gate transistors optimized for ultra low power, high performance, and high density product applications

S.-J. Choi, W. Hafez, M. Kang, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).