R. Desplats

Identification of some key parameters for photoelectric laser stimulation of IC: an experimental approach

P. Perdu, V. Pouget, D. Lewis, 2005, Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

A review of sample backside preparation techniques for VLSI

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2000 .

Dynamic Laser Stimulation Case Studies

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2005, Microelectron. Reliab..

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Oxide charge measurements in EEPROM devices

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2005, Microelectron. Reliab..

Light emission and TRE for a 120 nm technology case study: how much wavelength shift?

P. Perdu, R. Desplats, J. Roux, 2004, Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743).

Dynamic Thermal Laser Stimulation Theory and Applications

P. Perdu, D. Lewis, K. Sanchez, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Laser Stimulation Applied to Dynamic IC Diagnostics

P. Perdu, D. Lewis, F. Beaudoin, 2003 .

Backside Hot Spot Detection Using Liquid Crystal Microscopy

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Internal Testing of Programmable Circuits

P. Perdu, R. Desplats, 2000 .

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling

Franco Stellari, Alan J. Weger, Peilin Song, 2003, Microelectron. Reliab..

Direct Measurements of Charge in Floating Gate Transistor Channels of Flash Memories Using Scanning Capacitance Microscopy

P. Perdu, R. Desplats, C. Nardi, 2006 .