K. Sanchez

Identification of some key parameters for photoelectric laser stimulation of IC: an experimental approach

P. Perdu, V. Pouget, D. Lewis, 2005, Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..

Dynamic Laser Stimulation Case Studies

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2005, Microelectron. Reliab..

Dynamic Thermal Laser Stimulation Theory and Applications

P. Perdu, D. Lewis, K. Sanchez, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Failure Localization and design debug on mixed-mode ICs by using the dynamic laser stimulation techniques

Philippe Perdu, Kevin Sanchez, Olivier Crepel, 2007 .

Automatic localization of signal sources in photon emission images for integrated circuit analysis

S. Jacquir, P. Perdu, K. Sanchez, 2017, Signal, Image and Video Processing.

Failure Analysis of Damages on Advanced Technologies Induced by Picosecond Pulsed Laser During Space Radiation SEE Testing

C. T. Chua, C. Gan, K. Sanchez, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Pattern image enhancement by automatic focus correction

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2017, Microelectron. Reliab..

Lock-in thermography for defect localization and thermal characterization for space application

Vincent Bley, Thierry Lebey, K. Sanchez, 2018, Microelectron. Reliab..

ATE and lock-in thermography coupling techniques for a 3D defect localization in a 4-stacked die memory

Kevin Sanchez, Fulvio Infante, Nicolas Courjault, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).