H. Ueda
发表
T. Kachi,
T. Uesugi,
M. Kanechika,
2007
.
Tetsu Kachi,
Masahiro Sugimoto,
Tsutomu Uesugi,
2008
.
Inductively coupled plasma-induced defects in n-type GaN studied from Schottky diode characteristics
T. Kachi,
Y. Tokuda,
H. Ueda,
2006
.
T. Uesugi,
T. Ishikawa,
M. Iwamoto,
2014
.
T. Kimoto,
J. Suda,
T. Kachi,
2019,
IEEE Electron Device Letters.
T. Kachi,
Kazuhiro Yoshida,
Y. Tokuda,
2007
.
T. Kachi,
Y. Tokuda,
N. Soejima,
2006
.
A. Kikuchi,
H. Ueda,
Keita Takeuchi,
2019,
Japanese Journal of Applied Physics.
A. Kikuchi,
H. Ueda,
Keita Takeuchi,
2017
.
A. Kikuchi,
H. Ueda,
Y. Niinuma,
2016
.
M. Ishiko,
H. Ueda,
T. Sugiyama,
2004,
2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs.
T. Kachi,
T. Uesugi,
M. Sugimoto,
2007
.
T. Kachi,
T. Uesugi,
M. Sugimoto,
2006
.
M. Hori,
T. Kachi,
T. Uesugi,
2012
.
A. Kikuchi,
H. Ueda,
Keita Takeuchi,
2017
.
A. Usami,
Y. Tokuda,
H. Ueda,
1989
.
A. Usami,
H. Ueda,
H. Kano,
1992
.
T. Kachi,
T. Uesugi,
Y. Yamada,
2011
.
T. Kimoto,
J. Suda,
T. Kachi,
2019,
Japanese Journal of Applied Physics.
T. Kimoto,
J. Suda,
T. Kachi,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
A. Kikuchi,
H. Ueda,
Y. Niinuma,
2017
.
A. Usami,
Y. Tokuda,
H. Ueda,
1988
.
T. Kimoto,
J. Suda,
T. Kachi,
2019,
Applied Physics Letters.
Hiroyuki Ueda,
Tsuyoshi Ishikawa,
Tsutomu Uesugi,
2014,
Microelectron. Reliab..
A. Kikuchi,
H. Ueda,
Keita Takeuchi,
2017
.
T. Kachi,
M. Sugimoto,
T. Uesugi,
2005,
Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005..
T. Kimoto,
J. Suda,
T. Kachi,
2019,
2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD).