Tsu-Wei Tseng
发表
Jin-Fu Li,
Tsu-Wei Tseng,
Chih-Sheng Hou,
2010,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Chia-Hsin Lee,
Ding-Ming Kwai,
Yung-Fa Chou,
2014,
Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test.
Jin-Fu Li,
Tsu-Wei Tseng,
Chih-Sheng Hou,
2010,
2010 28th VLSI Test Symposium (VTS).
Jin-Fu Li,
Tsu-Wei Tseng,
Ting-Ju Chen,
2012,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Jin-Fu Li,
Tsu-Wei Tseng,
Chih-Sheng Hou,
2011,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Jin-Fu Li,
Tsu-Wei Tseng,
Jiunn-Der Yu,
2007,
2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT).
Yu-Jen Huang,
Jin-Fu Li,
Tsu-Wei Tseng,
2010,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Chia-Hsin Lee,
Ding-Ming Kwai,
Yung-Fa Chou,
2012,
Proceedings of Technical Program of 2012 VLSI Design, Automation and Test.
Chia-Hsin Lee,
Ding-Ming Kwai,
Yung-Fa Chou,
2013,
2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT).
Chin-Long Wey,
Jin-Fu Li,
Tsu-Wei Tseng,
2005,
Design, Automation and Test in Europe.
Jin-Fu Li,
Chao-Da Huang,
Tsu-Wei Tseng,
2006,
2006 International Symposium on VLSI Design, Automation and Test.
Jin-Fu Li,
Tsu-Wei Tseng,
Kevin Chiu,
2006,
2006 IEEE International Test Conference.
Chin-Long Wey,
Jin-Fu Li,
Chao-Da Huang,
2004,
The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings..
Jin-Fu Li,
Chao-Da Huang,
Tsu-Wei Tseng,
2007,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Jin-Fu Li,
Tsu-Wei Tseng,
Chih-Sheng Hou,
2010
.
Jin-Fu Li,
Tsu-Wei Tseng,
2009,
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis.
Jin-Fu Li,
Tsu-Wei Tseng,
Chih-Chiang Hsu,
2010,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Jin-Fu Li,
Tsu-Wei Tseng,
2008,
2008 IEEE International Test Conference.
Jin-Fu Li,
Tsu-Wei Tseng,
2011,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Yu-Jen Huang,
Jin-Fu Li,
Chun-Hsien Wu,
2007,
25th IEEE VLSI Test Symposium (VTS'07).
Jin-Fu Li,
Tsu-Wei Tseng,
Da-Ming Chang,
2006,
Proceedings of the Design Automation & Test in Europe Conference.
Jin-Fu Li,
Tsu-Wei Tseng,
Chih-Sheng Hou,
2010,
IEEE Design & Test of Computers.