J. Borgogno

Determination of the extinction coefficient of dielectric thin films from spectrophotometric measurements.

J. Borgogno, E. Pelletier, 1989, Applied optics.

Comparison of the properties of titanium dioxide films prepared by various techniques.

T H Allen, A Saxer, C K Carniglia, 1989, Applied optics.

Automatic determination of the optical constants of inhomogeneous thin films.

E Pelletier, J. Borgogno, E. Pelletier, 1982, Applied optics.

Multiple determination of the optical constants of thin-film coating materials.

H A Macleod, J A Dobrowolski, F C Ho, 1984, Applied optics.

Refractive index and inhomogeneity of thin films.

H A Macleod, E Pelletier, H. Macleod, 1984, Applied optics.

In situ and air index measurements: influence of the deposition parameters on the shift of TiO2/SiO2 Fabry-Perot filters.

E Pelletier, J. Borgogno, E. Pelletier, 1986, Applied optics.

An improved method for the determination of the extinction coefficient of thin film materials

P. Roche, J. Borgogno, B. Lazaridès, 1983 .