W. Davey

发表

Review and perspective of high-k dielectrics on silicon

I. Mitrovic, S. Hall, O. Buiu, 2007 .

Study of interfaces and band offsets in TiN/amorphous LaLuO3 gate stacks

I. Alexandrou, J. Schubert, V. Dhanak, 2011 .

Ellipsometric analysis of mixed metal oxides thin films

Steve Hall, Octavian Buiu, Ivona Z. Mitrovic, 2008 .

Estimate of dielectric density using spectroscopic ellipsometry

I. Mitrovic, S. Hall, O. Buiu, 2009 .

Reliability studies on Ta2O5 high-κ dielectric metal-insulator-metal capacitors prepared by wet anodization

I. Mitrovic, N. Sedghi, S. Hall, 2011 .

Leakage current effects on C-V plots of high- k metal-oxide-semiconductor capacitors

P. Hurley, S. Monaghan, K. Cherkaoui, 2009 .

Chemical and optical profiling of ultra thin high-k dielectrics on silicon

M. Mackenzie, B. Hamilton, S. Hall, 2008 .