Diwei Fan

Failure mechanism of leakage induced by pattern-dependent photo resist distortion

Miao Wu, Li Tian, Diwei Fan, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Leakage in CMOS devices induced by pattern-dependent microloading effect

Miao Wu, Li Tian, Diwei Fan, 2012, 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE).

Failure Analysis of damaged dielectric on resistor and capacitor with EMMI and IR-OBIRCH

Miao Wu, Li Tian, Diwei Fan, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Capacitor dielectric defect or damage localization by photon emission microscopy with the combination of OBIRCH

S. Yao, Miao Wu, Li Tian, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

A special failure analysis process to save some de-caped recovered cases

Winter Wang, Suying Yao, Miao Wu, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Simulation assisting EMMI technical to locate defect on capacitor in integrated circuit failure analysis

Dong Wang, Li Tian, Gaojie Wen, 2016, International Symposium on the Physical and Failure Analysis of Integrated Circuits.